Conference on Lasers and Electro-Optics 2021
DOI: 10.1364/cleo_at.2021.jtu3a.142
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Reflective Fourier Ptychographic Microscopy Using the Scheimpflug Scheme

Mojde Hasanzade
1
,
Nazabat Hussain
2
,
Dag W. Breiby
3
et al.

Abstract: We report a new approach for reflection mode Fourier ptychographic microscopy using the Scheimpflug geometry. Successful recovery of a USA resolution target is shown with 2NAb synthetic aperture.

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