Reflection spectra of oxide films on metals (Al, Cu, and Ti)

Васильев, А. Ф.; Gushanskaya, N. Yu.; Zhizhin, G. N.; Yakovlev, V. A.

doi:10.1007/bf00663292

Cited by 1 publication

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“…The ν LO band shows a blue shift as film thickness increases. The same effect was reported for the Cu 2 O -Cu [54] and TiO 2 -Al [55] systems. This shift [56], RbI [57], and GaAs [58a] ultrathin films on metals exhibit an additional decrease in the ν LO frequency, which cannot be described adequately using the dielectric function of the corresponding bulk materials.…”

Section: Effect In ''Metallic'' Irrassupporting

confidence: 82%

Interpretation of IR Spectra of Ultrathin Films

2003

Handbook of Infrared Spectroscopy of Ultrathin Films

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Generally speaking, IR spectral measurements of ultrathin films are undertaken to determine (i) the chemical identity of adsorbed species (including dissociation fragments); (ii) the geometric or structural arrangement (orientation) of these species and their positions with respect to the surface atoms of the substrate; (iii) their vibrational, rotational, and translational motion on the surface; (iv) the charge distribution and energy level structure of the valence electrons in both adsorbate and substrate; and (v) the effects of external perturbations, such as the electric and magnetic fields, photons, electrons, heating, and surface pressure on factors (i)-(iv) [1]. However, such information cannot be extracted directly from the IR spectra of ultrathin films due to the strong dependence of the shape and relative intensity of the bands on the geometry of the experiment, the optical properties of the substrate, the surroundings, the gradient of the optical properties at the film-substrate interface and in the film itself, as well as on the film thickness, and the particle size in the case of powder or islandlike supports. These effects and their physical background are discussed in Sections 3.1-3.5 and 3.9. In addition, there can be an intensity transfer between modes of coadsorbed species and a change in the band position with surface coverage. This effect is used for determining the mode of the surface filling and the degree of intermixing of different species at the surface (Section 3.6). If the film under study is located at the electrode-solution interface, the resulting spectrum is made up of contributions of all species in the path of radiation that are affected by the electrode potential, which further complicates the interpretation. Apart from technical means (Chapter 4), there exist analytical and mathematical approaches to resolve contributions of different species in such a complex spectrum (Sections 3.7 and 3.8). Another feature of the IR spectra of ultrathin films that is perhaps surprising and unexpected is their sensitivity to the volume fraction, shape, and orientation of inhomogeneities (e.g., pores or inclusions) in the film. Moreover, if the characteristic size of the 140

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Section: Effect In ''Metallic'' Irrassupporting

confidence: 82%

Interpretation of IR Spectra of Ultrathin Films

2003

Handbook of Infrared Spectroscopy of Ultrathin Films

View full text Add to dashboard Cite

show abstract

Reflection spectra of oxide films on metals (Al, Cu, and Ti)

Cited by 1 publication

References 5 publications

Interpretation of IR Spectra of Ultrathin Films

Interpretation of IR Spectra of Ultrathin Films

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