2005
DOI: 10.1063/1.1922789
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Reflection scanning near-field optical microscopy in ultrahigh vacuum

Abstract: A reflection scanning near-field optical microscope with polarization-sensitive light detection for operation in ultrahigh vacuum is presented. All necessary stages to reach the final goal of subwavelength resolution in magneto-optics are considered step by step, validating our approach and demonstrating the usefulness of the final instrument. A number of problems are attacked and discussed, but some are only treated to an extent necessary to bring the instrument to operation. Sub-λ resolution of a nonmagnetic… Show more

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Cited by 4 publications
(1 citation statement)
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“…For example, in 1999 Gray and Hsu reported on their development of a variable cryogenic temperature near-field scanning optical microscope. 8 In 2005, the development of a reflection mode NSOM capable of operation in an ultrahigh vacuum environment was reported 9 Clearly the application for which a microscope is to be used will determine its design. While the physical studies for which the above microscopes were designed require that they operate under extreme conditions (e.g.…”
Section: Introductionmentioning
confidence: 99%
“…For example, in 1999 Gray and Hsu reported on their development of a variable cryogenic temperature near-field scanning optical microscope. 8 In 2005, the development of a reflection mode NSOM capable of operation in an ultrahigh vacuum environment was reported 9 Clearly the application for which a microscope is to be used will determine its design. While the physical studies for which the above microscopes were designed require that they operate under extreme conditions (e.g.…”
Section: Introductionmentioning
confidence: 99%