1997
DOI: 10.1063/1.363957
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Reflection scanning near-field optical microscopy with uncoated fiber tips: How good is the resolution really?

Abstract: Simple fiber-optic confocal microscopy with nanoscale depth resolution beyond the diffraction barrier Rev. Sci. Instrum. 78, 093703 (2007);

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Cited by 80 publications
(45 citation statements)
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“…Hence topographical artifacts cannot be excluded, see e.g. [16,17], and these images should not be taken for the quantitative estimation of the near-field optical resolution achieved. Such quantitative study will be performed after the preparation of plastic fiber probes with the subwavelength-size aperture for light transmission (actually the first aluminum-coated PMMA aperture probes have been successfully prepared and their testing is in progress).…”
Section: Resultsmentioning
confidence: 99%
“…Hence topographical artifacts cannot be excluded, see e.g. [16,17], and these images should not be taken for the quantitative estimation of the near-field optical resolution achieved. Such quantitative study will be performed after the preparation of plastic fiber probes with the subwavelength-size aperture for light transmission (actually the first aluminum-coated PMMA aperture probes have been successfully prepared and their testing is in progress).…”
Section: Resultsmentioning
confidence: 99%
“…The phenomenon of increased near-field reflectivity was first described by Courjon et al 4 However, in contrast to the well established facts, an intriguing paper by Sandoghdar et al 5 claimed a decrease of the reflectivities upon shear-force approach due to interference effects and disputed the sudden discontinuity in the reflection signal as one approaches the tip to the sample. Unfortunately, that paper 5 confused the issue without providing relevant experimental details.…”
Section: Introductionmentioning
confidence: 96%
“…The reasons for the apparent non-awareness might be the necessity of well defined although easily executed experimentation, and failure if these are not acknowledged [7]. Our technique requires sharp uncoated tips with high aspect ratio and rapid optical shear-force control to avoid tip breakage in fast scans.…”
Section: Introductionmentioning
confidence: 99%
“…Our technique requires sharp uncoated tips with high aspect ratio and rapid optical shear-force control to avoid tip breakage in fast scans. SNOM tips will however inevitably break if etched silica fibers (too blunt with large taper angles of 30°-50°) are used to scan on platinum (a material with exceptionally poor shear-force response) so that only artifacts arose that were rightfully withdrawn in [7] because of the undue experimentation. Importantly, the proper experimentation requires an intensity meter for uninterrupted check of the tip quality.…”
Section: Introductionmentioning
confidence: 99%