Thermal wave imaging is proving to be a useful teehnique for the nondestruetive evaluation (NDE) of subsurfaee features of opaque solids. This imaging is aehieved with various intensity-modulated heat sources, such as laser or partiele beams, and with various detectors, sueh as microphones, ultrasonic transducers, inErared detectors, and laser probes. The authors have recently reviewed these techniques and their application to t\DE (1). Common to the techniques is the fact that they eaeh involve the interaction of a highly damped the nnal wave wi th sur face or subsur face therma 1 fea ture s. They al so have in coml:lOn tlle fact that the souree is localized. The techniques differ in that the detectors may be local or non-local to a greater or lesser degree. For example, the focused infrared detector is a local point telnperature detector; the mirage effect laser probe is a line de tec tor; and tlle mic ro phone i s an area detec tor. The prese.nce of the localized source gives alI of these methods tlle potential for high spatial resolution. The symmetry oE the non-locality of the detector, however, may seriously limit detection of particular kinds of flaws. For some of the detection schemes, comparisons between experiment and theory for imaging of flaws with simple geometry (planar eracks, cylindrical or spherical inclusions) are straightforward, and good agreement has been achieved in most cases. Other schemes, such as p iezoe lec t r ic de tec t ion, are lIIore complex in na ture. For exaOl ple, the details of the conversion Erom thermal energy to acoustie energy may involve several different processes, and no quantitative three-dimensional theoretical lIIodel yet exists to assess the relative importance of these processes. In this section we give a briei review of the principles of imaging in tlle extreme near field, followed by deseriptions of three splected experimental thermal wave imaging techniques, including geometrical considerations, signal-to-noise considerations, and examples of NDE applieations. For descriptions of other thermal wave imaging teehniques the reader is referred to the literature (1).TIle resolution of any microscope depends on its ability eitller to localize tlle illumination at tlle scatterer (typical of scanning microseopes) or to localize tlle region of the seatterer to whieh the detector is sensitive (such as in conventional microscopes, whieh focus different points of the scatterer on different detectors). In microscopes which usp lenses as focusing elements to achieve this localization, t!te localization is limited by the wavelengtll of tlle 293