2015
DOI: 10.1016/j.tsf.2015.05.019
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Reflectance and transmittance model for multilayer optical coatings with roughness at oblique incidence

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Cited by 4 publications
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“…Different properties of experimentally developed thin films can be measured frequently using different methods like electrochemical impedance spectroscopy, Atomic force microscopy x-ray photoelectron spectroscopy, Auger electron spectroscopy, infrared spectroscopy, Raman spectroscopy, and Mössbauer spectroscopy, electron microscopy photometric methods, spectrophotometric method etc). Subsequently, existing models are used to explain these properties [17,18], or new models are created to forecast them [19][20][21].…”
Section: Introductionmentioning
confidence: 99%
“…Different properties of experimentally developed thin films can be measured frequently using different methods like electrochemical impedance spectroscopy, Atomic force microscopy x-ray photoelectron spectroscopy, Auger electron spectroscopy, infrared spectroscopy, Raman spectroscopy, and Mössbauer spectroscopy, electron microscopy photometric methods, spectrophotometric method etc). Subsequently, existing models are used to explain these properties [17,18], or new models are created to forecast them [19][20][21].…”
Section: Introductionmentioning
confidence: 99%