Reference Materials in Geoanalytical Research ‐Review for 2004 and 2005

Jochum, Klaus Peter; Willbold, M.

doi:10.1111/j.1751-908x.2006.tb01057.x

Cited by 23 publications

(21 citation statements)

References 91 publications

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“…We have measured seven silicate glass standards: six MPI‐DING standards, prepared by Jochum and co‐workers,7, 8 and one NIST glass, SRM 610,9 in order to determine practical secondary ion yields and RSFs for a range of major and trace elements when using Au‐cluster SIMS. As the abundances of Li, Mg, V, Cr, Cs and Ba are not included on the original NIST certificate for SRM 610, these were instead taken from Pearce et al 10 Sputter rates for Au + , Au

_{2}^{+}

and Au

_{3}^{+}

ions have also been determined using the SRM 610 standard.…”

mentioning

confidence: 99%

Determination of relative sensitivity factors during secondary ion sputtering of silicate glasses by Au⁺, Au and Au ions

King

Henkel

Rost

et al. 2009

Rapid Comm Mass Spectrometry

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In recent years, Au-cluster ions have been successfully used for organic analysis in secondary ion mass spectrometry. Cluster ions, such as Au(2)(+) and Au(3)(+), can produce secondary ion yield enhancements of up to a factor of 300 for high mass organic molecules with minimal sample damage. In this study, the potential for using Au(+), Au(2)(+) and Au(3)(+) primary ions for the analysis of inorganic samples is investigated by analyzing a range of silicate glass standards. Practical secondary ion yields for both Au(2)(+) and Au(3)(+) ions are enhanced relative to those for Au(+), consistent with their increased sputter rates. No elevation in ionization efficiency was found for the cluster primary ions. Relative sensitivity factors for major and trace elements in the standards showed no improvement in quantification with Au(2)(+) and Au(3)(+) ions over the use of Au(+) ions. Higher achievable primary ion currents for Au(+) ions than for Au(2)(+) and Au(3)(+) allow for more precise analyses of elemental abundances within inorganic samples, making them the preferred choice, in contrast to the choice of Au(2)(+) and Au(3)(+) for the analysis of organic samples. The use of delayed secondary ion extraction can also boost secondary ion signals, although there is a loss of overall sensitivity.

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_{2}^{+}

and Au

_{3}^{+}

ions have also been determined using the SRM 610 standard.…”

mentioning

confidence: 99%

Determination of relative sensitivity factors during secondary ion sputtering of silicate glasses by Au⁺, Au and Au ions

King

Henkel

Rost

et al. 2009

Rapid Comm Mass Spectrometry

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“…MC‐ICP‐MS with use of a collision cell is a powerful method to measure the isotope abundance ratios of iron as well as other elements with serious polyatomic interferences 7. We found that argon‐based interferences on masses 54, 56 and 57, mainly 40 Ar 14 N, 40 Ar 16 O and 40 Ar 16 OH, could be completely removed.…”

Section: Discussionmentioning

confidence: 92%

Absolute measurements and certified reference material for iron isotopes using multiple‐collector inductively coupled mass spectrometry

Zhou¹,

Zhao²,

Wang³

et al. 2008

Rapid Comm Mass Spectrometry

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Two enriched isotopes, 99.94 at.% 56Fe and 99.90 at.% 54Fe, were blended under gravimetric control to prepare ten synthetic isotope samples whose 56Fe isotope abundances ranged from 95% to 20%. For multiple-collector inductively coupled plasma mass spectrometry (MC-ICP-MS) measurements typical polyatomic interferences were removed by using Ar and H2 as collision gas and operating the MC-ICP-MS system in soft mode. Thus high-precision measurements of the Fe isotope abundance ratios were accomplished. Based on the measurement of the synthetic isotope abundance ratios by MC-ICP-MS, the correction factor for mass discrimination was calculated and the results were in agreement with results from IRMM014. The precision of all ten correction factors was 0.044%, indicating a good linearity of the MC-ICP-MS method for different isotope abundance ratio values. An isotopic reference material was certified under the same conditions as the instrument was calibrated. The uncertainties of ten correction factors K were calculated and the final extended uncertainties of the isotopic certified Fe reference material were 5.8363(37) at.% 54Fe, 91.7621(51) at.% 56Fe, 2.1219(23) at.% 57Fe, and 0.2797(32) at.% 58Fe.

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“…2005, Jochum et al. 2005, Jochum and Willbold 2006) were used for external calibration following the method outlined in Liu et al. (2008a).…”

Section: Methodsmentioning

confidence: 99%

Direct Quantitative Determination of Trace Elements in Fine‐Grained Whole Rocks by Laser Ablation‐Inductively Coupled Plasma‐Mass Spectrometry

Gao

et al. 2010

Geostandard Geoanalytic Res

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Previous laser ablation‐ICP‐MS bulk analyses have been confined to volcanic glasses and glass disks or powder pellets similar to those used for XRF analysis. This study proposes a method to determine twenty trace elements (fourteen rare earth elements, Sc, Y, Zr, Nb, Hf and Ta) by LA‐ICP‐MS directly from polished thick sections and rock slabs of six fine‐grained crystalline and aphanitic rocks (five volcanic rocks and one pelitic tillite). Laser scanning of eight to ten 20 mm long linear tracks using a spot size of 160 μm, with a total ablated area of 26–32 mm2, was performed. Quantification was carried out by (a) internal standardisation using Si and (b) without applying internal standardisation. In the latter method, external determination of one element in conventional LA‐ICP‐MS quantification is no longer needed. Although the fine‐grained rocks studied contained variable amounts of volatiles (up to 4%), this method gave results that agree within 10% relative with those obtained by internal standardisation using Si. Two USGS basalt glass reference materials (BCR‐2G and BHVO‐2G) were used for external calibration. The results and the associated trace element patterns and ratios of elemental pairs obtained from both methods of quantification showed good agreement with the results from solution nebulisation ICP‐MS within 20% (mostly within 10%) relative. Fine‐grained rocks are common and include volcanic, sedimentary and low‐grade metamorphic rocks (e.g., basalt, andesite, rhyolite, shale, mudstone, tillite, loess, pelite and slate) and their trace element contents and associated ratios are important geochemical tracers in studies focusing on the composition and evolution of the crust and mantle. Our method provides a simple and quantitative way to determine trace elements in fine‐grained rocks even with those displaying complex textures.

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Reference Materials in Geoanalytical Research ‐Review for 2004 and 2005

Cited by 23 publications

References 91 publications

Determination of relative sensitivity factors during secondary ion sputtering of silicate glasses by Au⁺, Au and Au ions

Determination of relative sensitivity factors during secondary ion sputtering of silicate glasses by Au⁺, Au and Au ions

Absolute measurements and certified reference material for iron isotopes using multiple‐collector inductively coupled mass spectrometry

Direct Quantitative Determination of Trace Elements in Fine‐Grained Whole Rocks by Laser Ablation‐Inductively Coupled Plasma‐Mass Spectrometry

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Reference Materials in Geoanalytical Research ‐Review for 2004 and 2005

Cited by 23 publications

References 91 publications

Determination of relative sensitivity factors during secondary ion sputtering of silicate glasses by Au+, Au and Au ions

Determination of relative sensitivity factors during secondary ion sputtering of silicate glasses by Au+, Au and Au ions

Absolute measurements and certified reference material for iron isotopes using multiple‐collector inductively coupled mass spectrometry

Direct Quantitative Determination of Trace Elements in Fine‐Grained Whole Rocks by Laser Ablation‐Inductively Coupled Plasma‐Mass Spectrometry

Contact Info

Product

Resources

About

Determination of relative sensitivity factors during secondary ion sputtering of silicate glasses by Au⁺, Au and Au ions

Determination of relative sensitivity factors during secondary ion sputtering of silicate glasses by Au⁺, Au and Au ions