Redundancy Based on a Fault-Tolerant Gate Array Cell

Abstract

Radiation hardening by design (RHBD) has become a necessary practice when creating circuits to operate within radiated environments. While employing RHBD techniques has tradeoffs between size, speed and power, novel designs help to minimize these penalties. Space radiation is the primary source of radiation errors in circuits and two types of single event effects, single event upsets (SEU), and single event transients (SET) are increasingly becoming a concern. While numerous methods currently exist to nullify SEUs and SETs,