2022
DOI: 10.1016/j.solmat.2021.111410
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Reduction of trapping and recombination in upgraded metallurgical grade silicon: Impact of phosphorous diffusion gettering

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Cited by 3 publications
(2 citation statements)
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“…At low injection levels, trapping effects commonly observed in multicrystalline materials are clearly seen. The impact of carrier trapping in UMG-Si has been analyzed in detail elsewhere (Catalán-Gómez et al, 2021;Dasilva-Villanueva et al, 2022).…”
Section: Crystallization and Wafering: Characterization Before And Af...mentioning
confidence: 99%
“…At low injection levels, trapping effects commonly observed in multicrystalline materials are clearly seen. The impact of carrier trapping in UMG-Si has been analyzed in detail elsewhere (Catalán-Gómez et al, 2021;Dasilva-Villanueva et al, 2022).…”
Section: Crystallization and Wafering: Characterization Before And Af...mentioning
confidence: 99%
“…Among them, phosphorous diffusion gettering (PDG), an industrial compatible process commonly used during emitter formation in standard solar cell technology, has proved effective in improving the performance of UMG-Si. [7][8][9][10][11] The PDG process is used for driving diluted impurities, particularly transition metals, towards the wafer surface, where they can be effectively removed following an etching process. As a result, PDG-treated UMG-Si wafers have shown improved charge carrier lifetimes when compared with reference samples; [10,12,13] however, little is known yet about the impact of specific PDG treatments on UMG-Si-related charge carrier mobilities.…”
Section: Introductionmentioning
confidence: 99%