A simple dc glow discharge with controlled plasma
floating potential was applied as a novel source for plasma
immersion ion implantation with excellent results. The glow
discharge source is normally used for the conditioning of fusion
device chambers, taking advantage of the available high
accelerating potential which is necessary for the ion
bombardment of the walls. Combining an electron-emitting hot
filament with this source, it was possible to get a stable
discharge at pressures as low as 8×10-4 mbar and,
operating it with potentials lower then 70 V, it was possible to
reduce the Si sample etching down to zero from 2500 Å seen at
potentials of native 350 V, when exposure times of 750 min
were used in the sample's surface subjected to plasma ion
implantation of nitrogen. As a result, retained ion doses of
1.5×1017 cm-2 were obtained in etching-free Si
surfaces.