Reduction of Co–Cr–Pt media noise by addition of Ti to Cr underlayer

Matsuda, Yukio; Yahisa, Y.; Inagaki, Jun-ichi; Fujita, E.; Ishikawa, Akira; Hosoe, Y.

doi:10.1063/1.361322

Cited by 26 publications

(8 citation statements)

References 9 publications

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“…Although PNR is only sensitive to in-plane magnetization [34], we will show that the domain-wall structure in materials with perpendicular anisotropy can be determined. Thin films of CoCrPt, an alloy which has received significant attention for perpendicular magnetic recording media [35,36], were studied. The anisotropy was oriented perpendicular to the film plane by growing the Co grains epitaxially on a Ti underlayer so the Co c axis was oriented out of plane [37,38].…”

Section: Introductionmentioning

confidence: 99%

Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study

et al. 2014

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Ferromagnetic domain patterns and three-dimensional domain-wall configurations in thin CoCrPt films with perpendicular magnetic anisotropy were studied in detail by combining magnetic force microscopy and polarized neutron reflectometry with micromagnetic simulations. With the first method, lateral dimension of domains with alternative magnetization directions normal to the surface and separated by domain walls in 20-nm-thick CoCrPt films were determined in good agreement with micromagnetic simulations. Quantitative analysis of data on reflectometry shows that domain walls consist of a Bloch wall in the center of the thin film, which is gradually transformed into a pair of Néel caps at the surfaces. The width and in-depth thickness of the Bloch wall element, transition region, and Néel caps are found consistent with micromagnetic calculations. A complex structure of domain walls serves to compromise a competition between exchange interactions, keeping spins parallel, magnetic anisotropy orienting magnetization normal to the surface, and demagnetizing fields, promoting in-plane magnetization. It is shown that the result of such competition strongly depends on the film thickness, and in the thinner CoCrPt film (10 nm thick), simple Bloch walls separate domains. Their lateral dimensions estimated from neutron scattering experiments agree with micromagnetic simulations.

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Section: Introductionmentioning

confidence: 99%

Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study

et al. 2014

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“…Typically, seed layers such as NiAl are used to obtain smaller grain size in the case of glass substrates 1 and thin CrX ͑XϭMo, Ti, V, etc.͒ type 2 underlayers are used in the case of NiP/AlMg substrates. 3 However, for good preferred orientation ͑PO͒, grain sizes smaller than 10 nm are difficult to achieve based on NiAl seed layers. Moreover, NiAl seed layers do not provide an orientation ratio ͑OR͒ higher than 1 and therefore show a lower SNR than Cr-based seed layers or underlayers.…”

Section: Introductionmentioning

confidence: 99%

Ultrasmall grain size control in longitudinal recording media for ultrahigh areal densities

Piramanayagam

Dai

et al. 2002

Journal of Applied Physics

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In this study, we propose a new “atomic wall” approach to underlayer design. In this design, a CrX underlayer is used where X and Cr are not miscible in the bulk phase, resulting in a reduced grain size. We have studied the addition of Zr to Cr layers and found that CrZr gives magnetic properties comparable to those of CrMo underlayers. In addition, a CrZr underlayer gives rise to a smaller grain size of 5.5 nm, in comparison to a grain size of 6.2 nm in the case of CrMo underlayers. To our knowledge, this is the smallest grain size reported for Co-alloy recording media. The recording measurements also show a higher signal to noise ratio for CrZr underlayers than for CrMo underlayers, suggesting that CrZr underlayers have potential for use in ultrahigh areal densities.

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“…So far, most of the studies on CoCrPt alloy films concentrated on the control of the grain size and the grain size distribution, which is essential to media processing and to suppress the media noise by reducing the intergranular exchange interaction between the neighboring grains [7][8][9]. Studies of magnetization reversal of CoCrPt alloy films published so far have been performed by macroscopic measurement techniques as well as by theoretical magnetization reversal models [10,11].…”

Section: Introductionmentioning

confidence: 99%

Magnetization reversal behavior of nanogranular CoCrPt alloy thin films studied with magnetic transmission X-ray microscopy

Fischer

Eimüller

et al. 2005

Journal of Magnetism and Magnetic Materials

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Reduction of Co–Cr–Pt media noise by addition of Ti to Cr underlayer

Cited by 26 publications

References 9 publications

Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study

Domain-wall structure in thin films with perpendicular anisotropy: Magnetic force microscopy and polarized neutron reflectometry study

Ultrasmall grain size control in longitudinal recording media for ultrahigh areal densities

Magnetization reversal behavior of nanogranular CoCrPt alloy thin films studied with magnetic transmission X-ray microscopy

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