Reduced-order modelling for real-time physics-based variation simulation enhanced with adaptive sampling and optimized interpolation

Abstract

Manufacturing industries require a right-first-time paradigm to remain competitive. Variation simulation (VS) is a key tool to predict variation of the final shape of flexible assemblies, allowing to reduce defects and waste. VS models involving compliant sheet-metal parts commonly integrate physics-based simulation with statistical approaches (usually Monte Carlo simulation). Although increasingly used as a backbone of synthesis techniques for (stochastic) optimization of assembly systems, the main roadblock of VS methods is the intense computational costs due to time-intensive simulations and high-dimensional design space. Driven by the need of time reduction, this paper presents an innovative real-time physics-based VS model of assembly systems with compliant sheet-metal parts. The proposed methodology involves a non-intrusive reduced-order model (niROM), empowered by a novel adaptive sampling procedure for dataset generation, and a cross-validation-based optimized radial basis function (RBF) formulation for interpolation. Demonstrated through two case studies—(i) a remote laser welding operation to predict mechanical distortions, with two input parameters, and (ii) the assembly of an aircraft vertical stabilizer with five input parameters—the methodology achieves accurate real-time results, with up to a 43% improvement in accuracy compared to traditional sampling techniques. Findings highlight the critical influence of the sampling strategy and the number of input parameters on ROM accuracy. Better results are reached by employing adaptive sampling in combination with optimum RBF, which additionally disengages the user from the choice of the interpolation settings. This study unlocks new avenues in the field of variation simulation and dimensional/quality monitoring by narrowing the gap between any advanced CAE solver and VS models with real-time physics-based simulations.