2020
DOI: 10.3389/fchem.2020.00816
|View full text |Cite
|
Sign up to set email alerts
|

Redox Mechanism in Na-Ion Battery Cathodes Probed by Advanced Soft X-Ray Spectroscopy

Abstract: A Na-ion battery (NIB) device is a promising solution for mid-/large-scale energy storage, with the advantages of material abundance, low cost, and environmental benignity. To improve the NIB capacity and retainability, extensive efforts have been put into the developments of NIB electrode materials. The redox activities of the transition metal (TM)-based NIB electrodes are critical in defining the capacity and stability. Here, we provide a comprehensive review on recent studies of the redox mechanisms of NIB … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
10
0

Year Published

2021
2021
2023
2023

Publication Types

Select...
9

Relationship

1
8

Authors

Journals

citations
Cited by 12 publications
(10 citation statements)
references
References 78 publications
0
10
0
Order By: Relevance
“…However, the soft X-ray energy region represents a challenge for operando studies, even at synchrotron radiation sources [ 43 , 44 , 45 ]. Therefore, the use of DFT theoretical approaches is a powerful addition to laboratory experimental studies [ 46 ].…”
Section: Resultsmentioning
confidence: 99%
“…However, the soft X-ray energy region represents a challenge for operando studies, even at synchrotron radiation sources [ 43 , 44 , 45 ]. Therefore, the use of DFT theoretical approaches is a powerful addition to laboratory experimental studies [ 46 ].…”
Section: Resultsmentioning
confidence: 99%
“…However, many questions are still open, including the sequence of Na + (Li + ) extraction and H + insertion, the elements involved in the redox process, and to what extent does Na + (Li + )-H + exchange and TM oxidation participate in the reactions. Considering the severe structural changes during exposure and the coverage of various products on the particle surface, normal XAS and XPS might not be so reliable and other state-of-the-art characterizations are highly needed. …”
mentioning
confidence: 99%
“…The TFY mode is subsurface-sensitive with a probing depth of 50−100 nm depending on the sample. 173 However, it usually suffers from self-absorption and saturation effects, which is minimized by iPFY. In contrast, TEY mode probes a depth of a few nanometers and partial electron yield is even more shallow, attributed to the limited escaping depth for electrons compared to photons depending on mean free path.…”
Section: In Situ/operando Xasmentioning
confidence: 99%
“…The former includes total fluorescence yield (TFY), partial fluorescence yield (PFY), and inverse partial fluorescence yield (iPFY), whereas the latter consists of total electron yield (TEY), partial electron yield (PEY), and Auger electron yield (AEY). The TFY mode is subsurface-sensitive with a probing depth of 50–100 nm depending on the sample . However, it usually suffers from self-absorption and saturation effects, which is minimized by iPFY.…”
Section: In Situ/operando Xasmentioning
confidence: 99%