Recording of 6000 holograms by use of spectral hole burning

Abstract

Experiments verifying a new method of storing spectral hole-burning holograms, which yields reduced cross talk as compared with standard spectral hole-burning holograms, have been conducted. Results demonstrating the reduced width of this type of hologram in both frequency and the applied electric-field dimension are presented. Analytic solutions for the spectral width and diffraction efficiency of these holograms are presented. Using this exposure technique, we have recorded 6000 holograms in a single spectral hole-burning sample.

Photon‐echo quantum memory in solid state systems

“…By using the frequency dimension to address and store optical data, several thousands of data bits could be stored and addressed at a single spatial location, see e.g. [82,83]. The maximum number of data bits that theoretically could be stored in a single location was then given by the ratio, , between the inhomogeneous and homogeneous transition line-widths, inh and h , respectively.…”

Optical Stark spectroscopy of solids

“…Returning the field to its original value, recovers the corresponding hole pattern. In an elegant set of experiments Maniloff et al used both the frequency dimension and the electric field dimension to store 6000 holograms in a sample of chlorin-doped polyvinylbutyral (PVB) [38]. Related to these hole-burning storage ideas of using inhomogeneous electric fields, are recent proposals for the use of ''controlled reversible inhomogeneous broadening'' in quantum memory applications [39].…”

Power budget analysis of image-plane storage in spectral hole-burning materials

“…At cryogenic temperatures for example, Eu-YSO provides a per-spot capacity bound of CoB=Dn H ¼ 10 GHz/10 kHz=10 6 bits. It is this potentially large storage density that has motivated many previous studies of HBM-based optical memory including frequency-domain, time-domain, and hybrid approaches [9][10][11][12][13]. In contrast to previous analytical approaches [14][15][16][17], we start with fixed system requirements and known material parameters and then allow all other parameters (including spot size, written hole depth, and optical thickness) to vary in order to optimize the system design for minimum total (write and read) power requirements to achieve a high performance (non-archival) memory module.…”