Reconstruction of microchip structure at its interaction with high energy ion beams of NICA accelerator complex

Slivin, Alexey; Filatov, G.; Syresin, Evgeny; Zhemchugov, A.; Потылицын, А. П.

doi:10.1063/5.0063429

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Some Other Factors Affecting Ion Beam Diagnostics1

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2024

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“…Figure 5(a) compares various transverse Gaussian-profile real-beam parameters 𝜎 (transverse beam sizes) for a constant detector distance. As expected from the past, the real beam effects are masked for the lower 𝜎 value of 170μm (used in [19]). However, in ion-beam experiments, we can expect much greater 𝜎 values (see [12]), and therefore, we use another much greater sigma (1500μm).…”

Section: Some Other Factors Affecting Ion Beam Diagnosticssupporting

confidence: 53%

Feasibility of using optical Cherenkov radiation for non-relativistic ion beam diagnostics

Đurnić,

Potylitsyn,

Bogdanov

et al. 2024

J. Inst.

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In this paper, we propose to use quasi-monochromatic Cherenkov spectral lines for ion beam diagnostics. As representatives of light and heavy ions, we use C12 and Au197 ions, respectively. First, using the Geant4 toolkit, we determine the ionization lost energy as a function of the radiator penetration depth. After that, we use those data in the polarization currents method to compare the theoretical spectral lines with and without ionization losses. We also use the real-beam polarization currents method to analyze real-beam and setup parameters affecting the accuracy of the beam diagnostics. We emphasize that the precision of refractive index measurement might be a source of inaccuracy in ion beam diagnostics. Nevertheless, according to the provided data, we can expect that the method for measuring Cherenkov quasi-monochromatic spectral lines should be applicable for beam-diagnostics purposes, especially for lighter ions.

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Section: Some Other Factors Affecting Ion Beam Diagnosticssupporting

confidence: 53%