Abstract:X-ray diffraction crystallography allows non-destructive examination of crystal structures. Furthermore, it has low requirements regarding surface preparation, especially compared to electron backscatter diffraction. However, up to now, X-ray diffraction has been highly time-consuming in standard laboratory conditions since intensities on multiple lattice planes have to be recorded by rotating and tilting. Furthermore, examining oligocrystalline materials is challenging due to the limited number of diffraction… Show more
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