2010
DOI: 10.1016/j.ijmultiphaseflow.2009.11.005
|View full text |Cite
|
Sign up to set email alerts
|

Reconstruction of film thickness time traces for wavy turbulent free falling films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2011
2011
2020
2020

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 6 publications
(2 citation statements)
references
References 22 publications
0
2
0
Order By: Relevance
“…The wavelength is L. The wave height, H, is characterized by the difference between the highest point of the hump and the substrate underlying film. Besides using the VOF method to obtain the film shape, recently Kostoglou et al (2010) provided another approach to reconstruct the film thickness time traces.…”
Section: Wavy Surfacementioning
confidence: 99%
“…The wavelength is L. The wave height, H, is characterized by the difference between the highest point of the hump and the substrate underlying film. Besides using the VOF method to obtain the film shape, recently Kostoglou et al (2010) provided another approach to reconstruct the film thickness time traces.…”
Section: Wavy Surfacementioning
confidence: 99%
“…Iterations are then necessary to obtain a profile that satisfies the physical and statistical criteria. This method has been considerably refined over times [12], but is used here in its simplest form.…”
Section: Shape Of the Free Surfacementioning
confidence: 99%