Reconstruction of composite in-line electron holograms using a small emission cone

Holenstein, Roman; Rothwell, Timothy A.; Shegelski, Mark R. A.

doi:10.1016/s0304-3991(02)00237-1

Cited by 5 publications

(3 citation statements)

References 12 publications

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“…The restriction imposed by the beam intensity distribution may be overcome to some extent by forming a composite hologram from a number of smaller holograms, each obtained with centre of the beam shifted to emphasize the weaker fringes of the hologram (Holenstein et al , 2003). Figure 8 illustrates how shifting the beam makes the weaker fringes of a hologram more prominent.…”

Section: Composite Hologramsmentioning

confidence: 99%

Resolving power of lens‐less low energy electron point source microscopy

Stevens

2009

Journal of Microscopy

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SummarySimulations show the resolving power of lens-less low energy electron point source microscopy to be approximately 15 Å for electron energies of between 14 and 105 eV. This resolution can be improved to 10 Å by employing a composite hologram method. However, these values fall short of predictions of at least 3 Å resolution for electron energies in this range because the limited divergence angle of the electron beam had not previously been taken into account. Also shown is that electron coherence from field emitting tips that terminate in a single atom will not limit the resolving power as much as the beam divergence angle. The penetration depth of electrons with energies of between 50 and 100 eV, into biological molecules, was estimated from the inelastic mean free path length to be 25 Å . This places an upper limit on the size of biological molecules for which internal structural information can be obtained using low energy electrons.

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Section: Composite Hologramsmentioning

confidence: 99%

Resolving power of lens‐less low energy electron point source microscopy

Stevens

2009

Journal of Microscopy

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“…Since then, all experimentally observed features in LEEPS images have had their smallest feature in the range of ∼2 nm [35,19,1,36]. Recently the resolution gap between these experimental results and theoretical predictions [4,40] was examined by Stevens [41]. In this theoretical work the effect of the limited divergence angle of the electron beam was included in the calculation of the theoretical resolution limit in LEEPS microscopy.…”

Section: Resolutionmentioning

confidence: 99%

Low energy electron point source microscopy: beyond imaging

Beyer

Gölzhäuser²

2010

J. Phys.: Condens. Matter

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Low energy electron point source (LEEPS) microscopy has the capability to record in-line holograms at very high magnifications with a fairly simple set-up. After the holograms are numerically reconstructed, structural features with the size of about 2 nm can be resolved. The achievement of an even higher resolution has been predicted. However, a number of obstacles are known to impede the realization of this goal, for example the presence of electric fields around the imaged object, electrostatic charging or radiation induced processes. This topical review gives an overview of the achievements as well as the difficulties in the efforts to shift the resolution limit of LEEPS microscopy towards the atomic level. A special emphasis is laid on the high sensitivity of low energy electrons to electrical fields, which limits the structural determination of the imaged objects. On the other hand, the investigation of the electrical field around objects of known structure is very useful for other tasks and LEEPS microscopy can be extended beyond the task of imaging. The determination of the electrical resistance of individual nanowires can be achieved by a proper analysis of the corresponding LEEPS micrographs. This conductivity imaging may be a very useful application for LEEPS microscopes.

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“…Bardon et al [18] achieved with the LEEPS microscope on MgO crystallites a better resolution than with their conventional scanning electron microscope (SEM). A theoretical group predicts even atomic resolution for LEEPS microscopy on certain cluster by a tomographic approach [19][20][21]. Improvements in the reconstruction of holographic images were achieved by a novel approach to solve the twin-image problem [22].…”

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confidence: 99%

Characterization of nanowires with the low energy electron point source (LEEPS) microscope

Beyer

Weber

Völkel

2010

Physica Status Solidi (b)

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The low energy electron point source (LEEPS) microscope is an instrument for the characterization of structural, electrical, and mechanical properties of single molecules and nanostructures. In this work, we review our efforts in advancing LEEPS as tool for the characterization of electric properties of nanowires. Individual nanowires of different size and material were examined, including compositions of metallic as well as semiconducting character. The nanowires were characterized by electrical conductance measurements with a metallic tip as movable electrode and the sample support as its counterpart. Beyond these measurements, we developed a scheme to deduce the electrical conductivity of a single nanowire directly from its LEEPS image. This substantially reduces the data acquisition time and widens the applicability of LEEPS microscopy.

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Reconstruction of composite in-line electron holograms using a small emission cone

Cited by 5 publications

References 12 publications

Resolving power of lens‐less low energy electron point source microscopy

Resolving power of lens‐less low energy electron point source microscopy

Low energy electron point source microscopy: beyond imaging

Characterization of nanowires with the low energy electron point source (LEEPS) microscope

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