Reconstruction of a high-resolution image on a compound-eye image-capturing system

Kitamura, Yoshiro; Shogenji, Rui; Yamada, Kenji; Miyatake, Shigehiro; Miyamoto, Masatoshi; Morimoto, Takashi; Yasugi, Masaki; Kondou, Noriyuki; Miyazaki, Daisuke; Tanida, Jun; Ichioka, Yoshiki

doi:10.1364/ao.43.001719

Cited by 95 publications

(70 citation statements)

References 9 publications

(10 reference statements)

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Park et al 6 have conducted a comprehensive review of existing methods. Registration techniques as well as reconstruction algorithms have been adapted to multi-aperture systems, for example by Nitta et al 7 and Kanaev et al 8,9 However, for images from real-world systems, simple shift-and-add schemes preceded by calibration with sub-pixel accuracy have remained popular, for example as reported by Kitamura et al 10 An extended version of this type of scheme is also used for reconstructing images from the eCLEY.…”

Section: Related Workmentioning

confidence: 99%

Resolution and sensitivity of wafer-level multi-aperture cameras

Oberdörster

Lensch

2013

J. Electron. Imaging

View full text Add to dashboard Cite

Abstract. The scaling limits of multi-aperture systems have been widely discussed from an information-theoretical standpoint. While these arguments are valid as an upper limit, the real-world performance of systems for mobile devices remains restricted by optical aberrations. We argue that aberrations can be more easily controlled with certain architectures of multi-aperture systems, especially those manufactured on wafer scale (wafer-level optics, WLO). We complement our analysis with measurements of one single-and one multiaperture WLO camera. We examine both sharpness and sensitivity, giving measurements of modulation transfer function and temporal noise, and showing that multi-aperture systems can indeed reduce size without compromising performance. © The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.

show abstract

Section: Related Workmentioning

confidence: 99%

Resolution and sensitivity of wafer-level multi-aperture cameras

Oberdörster

Lensch

2013

J. Electron. Imaging

View full text Add to dashboard Cite

show abstract

“…The nonredundancy is usually obtained by subpixel shifts between the images. By applying a superresolution reconstruction on all these small images, a single image with an enhanced angular resolution can be reconstructed [14].…”

Section: Introductionmentioning

confidence: 99%

Demonstration of an infrared microcamera inspired by Xenos peckii vision

Druart¹,

Guérineau²,

Haïdar³

et al. 2009

Appl. Opt.

View full text Add to dashboard Cite

We present an original and compact optical system inspired by the unusual eyes of a Strepsipteran insect called Xenos peckii. It is designed for a field of view of 30°and is composed of multiple telescopes. An array of prisms of various angles is placed in front of these telescopes in order to set a different field of view for each channel. This type of camera operates in the [ 3 − 5 μm] spectral bandwidth and is entirely integrated in a Dewar in order to maximize its compactness. Experimental images are presented to validate this design.

show abstract

“…The image is not of superior quality but the system illustrates the fact that reduction in the thickness of the optical system could be obtained using this concept. Subsequently, efforts were focused upon improving the reconstructed image quality either through improvements in optical design or image processing techniques [6,7,8]. A reduction in the form factor of infrared cameras could be obtained using the similar concept.…”

Section: Introductionmentioning

confidence: 99%

Ultra-thin multiple-channel LWIR imaging systems

et al. 2006

View full text Add to dashboard Cite

Infrared camera systems may be made dramatically smaller by simultaneously collecting several low-resolution images with multiple narrow aperture lenses rather than collecting a single high-resolution image with one wide aperture lens. Conventional imaging systems consist of one or more optical elements that image a scene on the focal plane. The resolution depends on the wavelength of operation and the f-number of the lens system, assuming a diffraction limited operation. An image of comparable resolution may be obtained by using a multi-channel camera that collects multiple low-resolution measurements of the scene and then reconstructing a high-resolution image. The proposed infrared sensing system uses a three-by-three lenslet array with an effective focal length of 1.9mm and overall system length of 2.3mm, and we achieve image resolution comparable to a conventional single lens system having a focal length of 5.7mm and overall system length of 26mm. The high-resolution final image generated by this system is reconstructed from the noisy low-resolution images corresponding to each lenslet; this is accomplished using a computational process known as superresolution reconstruction. The novelty of our approach to the superresolution problem is the use of wavelets and related multiresolution method within a Expectation-Maximization framework to improve the accuracy and visual quality of the reconstructed image. The wavelet-based regularization reduces the appearance of artifacts while preserving key features such as edges and singularities. The processing method is very fast, making the integrated sensing and processing viable for both time-sensitive applications and massive collections of sensor outputs.

show abstract

Reconstruction of a high-resolution image on a compound-eye image-capturing system

Cited by 95 publications

References 9 publications

Resolution and sensitivity of wafer-level multi-aperture cameras

Resolution and sensitivity of wafer-level multi-aperture cameras

Demonstration of an infrared microcamera inspired by Xenos peckii vision

Ultra-thin multiple-channel LWIR imaging systems

Contact Info

Product

Resources

About