2015
DOI: 10.1063/1.4926726
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Recombination by grain-boundary type in CdTe

Abstract: We conducted cathodoluminescence (CL) spectrum imaging and electron backscatter diffraction on the same microscopic areas of CdTe thin films to correlate grain-boundary (GB) recombination by GB “type.” We examined misorientation-based GB types, including coincident site lattice (CSL) Σ = 3, other-CSL (Σ = 5–49), and general GBs (Σ > 49), which make up ∼47%–48%, ∼6%–8%, and ∼44%–47%, respectively, of the GB length at the film back surfaces. Statistically averaged CL total intensities were calculated for … Show more

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Cited by 78 publications
(54 citation statements)
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“…Dark contrast is seen at the grain boundaries in the upper region of the bevel (the CdTe layer). This observation is consistent with previous CL measurements on non-alloyed CdTe devices and demonstrates that the grain boundaries act as recombination centres [5]. The behavior can be seen more clearly in the higher magnification image in Fig.…”
Section: Resultssupporting
confidence: 92%
“…Dark contrast is seen at the grain boundaries in the upper region of the bevel (the CdTe layer). This observation is consistent with previous CL measurements on non-alloyed CdTe devices and demonstrates that the grain boundaries act as recombination centres [5]. The behavior can be seen more clearly in the higher magnification image in Fig.…”
Section: Resultssupporting
confidence: 92%
“…Here, we observe that the GB contrast is significantly lower than the contrast at the intragrain defects (IGDs). In polycrystalline CdTe, it is more typical to observe a larger GB contrast . The CL results suggest that IGDs in CdSeTe contribute significantly to nonradiative losses and that GBs are relatively benign.…”
mentioning
confidence: 85%
“…We restrict this work to grain sizes d which are greater than 2 W GB , so that the grain is not fully depleted. For a doping density 10 15 cm −3 this requirement implies d > 2 μ m. As a point of comparison, recent cathodoluminescence spectrum imaging 27 shows that the average grain size in CdTe thin films (excluding twin boundaries) is 2.3 μ m.…”
Section: Physical Model Of the Grain Boundary And Restrictionsmentioning
confidence: 99%