2019
DOI: 10.1063/1.5098459
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Recombination and bandgap engineering in CdSeTe/CdTe solar cells

Abstract: Selenium compositional grading in CdTe-based thin-film solar cells substantively improves carrier lifetime and performance. However, where and how recombination lifetime improves has not been studied significantly. Here, we deposit a CdSexTe1−x/CdTe bilayer on MgZnO/SnO2/glass, which achieves a short-circuit current density greater than 28 mA/cm2 and carrier lifetimes as long as 10–20 ns. We analyze the grain structure, composition, and recombination through the thickness of the absorber using electron backsca… Show more

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Cited by 79 publications
(46 citation statements)
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“…Here, we observe that the GB contrast is significantly lower than the contrast at the intragrain defects (IGDs). In polycrystalline CdTe, it is more typical to observe a larger GB contrast . The CL results suggest that IGDs in CdSeTe contribute significantly to nonradiative losses and that GBs are relatively benign.…”
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confidence: 85%
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“…Here, we observe that the GB contrast is significantly lower than the contrast at the intragrain defects (IGDs). In polycrystalline CdTe, it is more typical to observe a larger GB contrast . The CL results suggest that IGDs in CdSeTe contribute significantly to nonradiative losses and that GBs are relatively benign.…”
mentioning
confidence: 85%
“…ERE in CdTe solar cells is only 10 −6 (10 −4 %) . CdTe absorbers alloyed with Se (CdSe x Te 1− x ) used in high‐efficiency solar cells have improved carrier lifetimes, PL, and cathodoluminescence (CL) intensity, but ERE or PLQY in CdSe x Te 1− x has not been reported. One complication for analyzing semiconductor electronic properties is surface and interface recombination.…”
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confidence: 99%
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“…Two-photon excitation TRPL measurements performed on an interdiffused CdTe 1−x Se x /CdTe absorber (close space sublimation, CdCl 2 treated, resulting maximum Se content x ≈ 0.16) have shown lifetimes of around an order of magnitude higher in the Se-rich front layer compared to the CdTe back layer. This lifetime difference within a single absorber was linked to reduced recombination at the grain boundaries in the Se-containing region [51,53]. Se therefore, at least up to x ≈ 0.2, seems to provide both passivation of a bulk defect and of the grain boundaries, resulting in an overall increased lifetime.…”
Section: Electronic Propertiesmentioning
confidence: 99%
“…In order to get a reliable measure for the bulk minority carrier lifetime, the surface has to be passivated, e.g., using Al 2 O 3 , which provides field-effect passivation [52]. Another approach is two-photon excitation (2PE) TRPL, which allows for lifetime measurements at a selected depth of the absorber [51,53]. In CdTe 1−x Se x layers (x = 0.2, deposited by close space sublimation and subjected to CdCl 2 treatment) with both surfaces passivated by sputtered Al 2 O 3 , lifetimes of up to 430 ns were measured, an order of magnitude higher than lifetimes in similarly passivated CdTe [23].…”
Section: Electronic Propertiesmentioning
confidence: 99%