Reciprocal space mapping and strain scanning using X-ray diffraction microscopy

Poulsen, Henning Friis; Cook, Phil; Leemreize, Hanna; Pedersen, Anne Juul; Yildirim, Can; Kutsal, Mustafacan; Jakobsen, Anders Clemen; Trujillo, J. X.; Ormstrup, Jeppe; Detlefs, C.

doi:10.1107/s1600576718011378

Cited by 25 publications

(45 citation statements)

References 39 publications

(42 reference statements)

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“…Hence, using this simple difference equation we can generate high-resolution q maps. Poulsen et al (2018) also found that the FWHM of the resolution function in the BFP can be ÁQ/|Q 0 | = 4 Â 10 À5 or better in all directions, which is substantially smaller than the angular range of the diffracted beam. We conclude that by placing an aperture in the BFP we can generate a 5D data set.…”

Section: Mapping Dislocations Using An Aperture In the Back Focal Planementioning

confidence: 91%

“…The intensity distribution in this back focal plane (BFP) is equivalent to the distribution in the Fraunhofer far-field limit. Poulsen et al (2018) present a complementary description of the optical properties of the BFP. Here an alternative approach to mapping the local tilt and local axial strain is provided under the heading of local reciprocal-space mapping.…”

Section: The Dark-field X-ray Microscopy Setupmentioning

confidence: 99%

“…By inserting an aperture in the BFP, one selects a certain region in reciprocal space and uses the diffracted signal within this region to generate contrast so as to image features within the sample such as dislocations. Poulsen et al (2018) introduce the equivalent technique for hard X-ray microscopy. The relation between position (y B , z B ) in the BFP, the angular offset in rocking angle À 0 and reciprocal space is…”

Section: Mapping Dislocations Using An Aperture In the Back Focal Planementioning

confidence: 99%

“…Unfortunately, if the aperture gap D is smaller than or comparable to the diffraction limit /NA, the spatial resolution in the imaging plane will deteriorate. On the other hand, using wavefront propagation Poulsen et al (2018) demonstrated that the aperture will not influence the spatial resolution if the gap is sufficiently large. For a specific application introduced below, the minimum gap is 80 mm.…”

Section: Mapping Dislocations Using An Aperture In the Back Focal Planementioning

confidence: 99%

“…Similarly to optical microscopy or TEM, the microscope is also associated with a Fourier/diffraction plane, the back focal plane. Detailed descriptions of the optical properties in the image plane and the back focal plane are given by Poulsen et al (2017) and Poulsen et al (2018), respectively.…”

Section: Introductionmentioning

confidence: 99%

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Mapping of individual dislocations with dark-field X-ray microscopy

et al. 2019

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This article presents an X-ray microscopy approach for mapping deeply embedded dislocations in three dimensions using a monochromatic beam with a low divergence. Magnified images are acquired by inserting an X-ray objective lens in the diffracted beam. The strain fields close to the core of dislocations give rise to scattering at angles where weak beam conditions are obtained. Analytical expressions are derived for the image contrast. While the use of the objective implies an integration over two directions in reciprocal space, scanning an aperture in the back focal plane of the microscope allows a reciprocal-space resolution of ÁQ/Q < 5 Â 10 À5 in all directions, ultimately enabling highprecision mapping of lattice strain and tilt. The approach is demonstrated on three types of samples: a multi-scale study of a large diamond crystal in transmission, magnified section topography on a 140 mm-thick SrTiO 3 sample and a reflection study of misfit dislocations in a 120 nm-thick BiFeO 3 film epitaxially grown on a thick substrate. With optimal contrast, the half-widths at half-maximum of the dislocation lines are 200 nm. A. C. Jakobsen et al. Mapping of dislocation networks 127 Figure 5Projection images of a large single-crystal diamond in the transmission experiment. (Left) Nearfield detector image with no X-ray objective and (right) corresponding dark-field image acquired with the diffraction microscope, both for À 0 = 0.002 . The magnification of the microscope is M ¼ 16:2. The direction of the rotation axis is marked by an arrow.q q 2 andq q roll are parallel to the x and y axes of these subfigures, respectively.

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Section: Mapping Dislocations Using An Aperture In the Back Focal Planementioning

confidence: 91%

Section: The Dark-field X-ray Microscopy Setupmentioning

confidence: 99%

Section: Mapping Dislocations Using An Aperture In the Back Focal Planementioning

confidence: 99%

Section: Mapping Dislocations Using An Aperture In the Back Focal Planementioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Mapping of individual dislocations with dark-field X-ray microscopy

et al. 2019

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Effect of La1−xSrxMnO3 (x = 0.2, 0.3, 0.5) buffer layer on the superconducting properties of GdBa2Cu3O7−δ

Song

Park

et al. 2022

J. Korean Phys. Soc.

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Recent Progress of Synchrotron X-Ray Imaging and Diffraction on the Solidification and Deformation Behavior of Metallic Materials

Peng

Miao

Sun

et al. 2021

Acta Metall. Sin. (Engl. Lett.)

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Characterizing the microstructure and deformation mechanism associated with the performances and properties of metallic materials is of great importance in understanding the microstructure-property relationship. The past few decades have witnessed the rapid development of characterization techniques from optical microscopy to electron microscopy, although these conventional methods are generally limited to the sample surface because of the intrinsic opaque nature of metallic materials. Advanced synchrotron radiation (SR) facilities can produce X-rays with strong penetrability and high spatiotemporal resolution, and thereby enabling the non-destructive visualization of full-field structural information in three dimensions. Tremendous endeavors were devoted to the 3rd generation SR over the past three decades, in which X-ray beams have been focused down to 100 nm. In this paper, recent progresses on SR-related characterization technologies were reviewed, with particular emphases on the fundamentals of synchrotron X-ray imaging and synchrotron X-ray diffraction, as well as their applications in the in situ observations of material preparation (e.g., in situ dendrite growth during solidification) and service under extreme environment (e.g., in situ mechanics). Future innovations toward next-generation SR and newly emerging SRbased technologies such as dark-field X-ray microscopy and Bragg coherent X-ray diffraction imaging were also advocated.

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Reciprocal space mapping and strain scanning using X-ray diffraction microscopy

Cited by 25 publications

References 39 publications

Mapping of individual dislocations with dark-field X-ray microscopy

Mapping of individual dislocations with dark-field X-ray microscopy

Effect of La1−xSrxMnO3 (x = 0.2, 0.3, 0.5) buffer layer on the superconducting properties of GdBa2Cu3O7−δ

Recent Progress of Synchrotron X-Ray Imaging and Diffraction on the Solidification and Deformation Behavior of Metallic Materials

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