Nanomaterial characterization using microwaves is needed in nanoscale
semiconductor devices, microwave imaging, EM shielding, and wireless
communication. Many nanomaterials are used as metallic or dielectric
layers in these applications. In this paper, we report the characterization
of nanomaterials using planar Microwave Slot Resonator (MSR) which
was designed and studied using 3D EM simulation tool. The response
of MSR is parameterized which offers a platform to calculate relative
permittivity (ε
r) and conductivity (σ) from
measured high frequency response of nanomaterial loaded MSR. With
simplified method, this microwave characterization offers accurate
and faster results which be used in design, calculation and numerical
analysis of nanomaterial based electronic/optoelectronic devices and
sensor/shielding applications.