Recent progress in scanning electron microscopy for the characterization of fine structural details of nano materials

Suga, Mitsuo; Asahina, Shunsuke; Sakuda, Yusuke; Kazumori, Hiroyoshi; Nishiyama, Hidetoshi; Nokuo, Takeshi; Alfredsson, Viveka; Kjellman, Tomas; Stevens, Sam M.; Cho, Hae Sung; Cho, Minhyung; Han, Lu; Che, Shunai; Anderson, Michael W.; Schüth, Ferdi; Deng, Hexiang; Yaghi, Omar M.; Liu, Zheng; Jeong, Hu Young; Stein, Andreas; Sakamoto, Kazuyuki; Ryoo, Ryong; Terasaki, Osamu

doi:10.1016/j.progsolidstchem.2014.02.001

Cited by 73 publications

(43 citation statements)

References 92 publications

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“…Especially, with the development of through-the-lens detection systems, which permit a reduced landing energy (the energy of the primary beam before impacting the sample) and the selection of highresolution, topographically specific emitted electrons, the high resolution (HR) SEM technique has been developed as a powerful tool in the study of the fine structure of nanomaterials. 178 SEM has been often employed for the characterization of hierarchical zeolites. The results showed that the image obtained using a lower landing energy of 80 eV (Fig.…”

Section: Electron Microscopymentioning

confidence: 99%

Tailoring and visualizing the pore architecture of hierarchical zeolites

et al. 2015

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Recently the concept of hierarchical zeolites invoked more explicit attention to enhanced accessibility of zeolites. By realizing additional meso-/macroporosity with the intrinsic microporosity of zeolites, a hierarchical pore system arises which facilitates mass transport while maintaining the zeolite shape selectivity. A great number of synthesis strategies have been developed for tailoring the pore architecture of hierarchical zeolites. In this review, we give a general overview of different synthesis methods for introduction of additional porosity. Advantages and limitations of these different synthesis approaches are addressed. The assessment of pore structure is essential to build the link between the zeolite pore structure and its functionality. A variety of 2D and 3D microscopy techniques are crucial to visualize the hierarchical pore structure, providing unique and comprehensive information that, however, should be linked to the results of bulk characterization techniques as much as possible. The microscopy techniques are classified and discussed according to the different probes used, such as optical light, X-rays and electrons. Representative work is reviewed to elucidate the capability of each technique and their drawbacks.

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Section: Electron Microscopymentioning

confidence: 99%

Tailoring and visualizing the pore architecture of hierarchical zeolites

et al. 2015

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“…Table 1 provides a comparison between the typical brightness, energy spread, and source size of thermionic, Schottky and cold field emission guns. 31 Crystallographic techniques in the SEM, relying on the detection of backscattered or forescattered electrons (BSE/FSE) of energies close to the energy of the primary electron beam, have benefited from the availability of these advanced electron sources, associated with higher electron back-/forescatter signal-to-noise ratios and smaller probe sizes. A lower acceleration voltage is beneficial to reduce the probe volume for studies on bulk samples.…”

Section: Developments In Scanning Electron Microscopymentioning

confidence: 99%

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confidence: 99%

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Recent Developments of Crystallographic Analysis Methods in the Scanning Electron Microscope for Applications in Metallurgy

Borrajo-Pelaez

Hedström

2017

Critical Reviews in Solid State and Materials Sciences

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The field of metallurgy has greatly benefited from the development of electron microscopy over the last two decades. Scanning electron microscopy (SEM) has become a powerful tool for the investigation of nano-and microstructures. This article reviews the complete set of tools for crystallographic analysis in the SEM, i.e., electron backscatter diffraction (EBSD), transmission Kikuchi diffraction (TKD), and electron channeling contrast imaging (ECCI). We describe recent relevant developments in electron microscopy, and discuss the state-of-the-art of the techniques and their use for analyses in metallurgy. EBSD orientation measurements provide better angular resolution than spot diffraction in TEM but slightly lower than Kikuchi diffraction in TEM, however, its statistical significance is superior to TEM techniques. Although spatial resolution is slightly lower than in TEM/ STEM techniques, EBSD is often a preferred tool for quantitative phase characterization in bulk metals. Moreover, EBSD enables the measurement of lattice strain/rotation at the sub-micron scale, and dislocation density. TKD enables the transmitted electron diffraction analysis of thin-foil specimens. The small interaction volume between the sample and the electron beam enhances considerably the spatial resolution as compared to EBSD, allowing the characterization of ultra-finegrained metals in the SEM. ECCI is a useful technique to image near-surface lattice defects without the necessity to expose two free surfaces as in TEM. Its relevant contributions to metallography include deformation characterization of metals, including defect visualization, and dislocation density measurements. EBSD and ECCI are mature techniques, still undergoing a continuous expansion in research and industry. Upcoming technical developments in electron sources and optics, as well as detector instrumentation and software, will likely push the border of performance in terms of spatial resolution and acquisition speed. The potential of TKD, combined with EDS, to provide crystallographic, chemical, and morphologic characterizations of nano-structured metals will surely be a valuable asset in metallurgy.

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“…The reflected beam from the surface of the soil sample produces different types of emission and captured by multi detectors. The topographical and compositional information can be assessed by analysis of specific type of collected electron (Suga et al 2014). …”

Section: Scanning Electron Microscope (Sem)mentioning

confidence: 99%

Engineering applications of organic surfactant modified bentonite in sorptive soil barriers.

Javadi¹

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Recent progress in scanning electron microscopy for the characterization of fine structural details of nano materials

Cited by 73 publications

References 92 publications

Tailoring and visualizing the pore architecture of hierarchical zeolites

Tailoring and visualizing the pore architecture of hierarchical zeolites

Recent Developments of Crystallographic Analysis Methods in the Scanning Electron Microscope for Applications in Metallurgy

Engineering applications of organic surfactant modified bentonite in sorptive soil barriers.

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