Recent Progress in Modulated Photothermal Radiometry

Corona, Javier; Kandadai, Nirmala

doi:10.3390/s23104935

Cited by 3 publications

(1 citation statement)

References 77 publications

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“…Numerous methods have been employed to ascertain and analyze the thermal behavior of multilayer structures. For instance, photothermal infrared radiometry and thermoreflectance [ 6 , 7 ] have been widely used by researchers. However, when dealing with thin films, the low absorbance of these materials often requires more sensitive methods to achieve accurate results.…”

Section: Introductionmentioning

confidence: 99%

Measuring Thermal Diffusivity of Azoheteroarene Thin Layers by Photothermal Beam Deflection and Photothermal Lens Methods

Mikaeeli,

Korte,

Cabrera

et al. 2023

Materials

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Measurement of thermal properties of thin films is challenging. In particular, thermal characterization is very difficult in semi-transparent samples. Here, we use two photothermal methods to obtain information about the thermal diffusivity as well as thermal conductivity of azoheteroarene functionalized polymer thin layers. The photothermal beam deflection (PBD) method is employed to gather data directly on thermal conductivity and thermal diffusivity, while the thermal lens (TL) method is employed to measure the effective thermal diffusivity. Consequently, the thermal diffusivity of the layers is indirectly estimated from the effective thermal diffusivity using a well-established theoretical relationship. Despite the utilization of distinct methods, our study reveals a remarkable consistency in the highly accurate results obtained from both approaches. This remarkable agreement reaffirms the reliability and mutual compatibility of the employed methods, highlighting their shared ability to provide accurate and congruent outcomes.

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Section: Introductionmentioning

confidence: 99%

Measuring Thermal Diffusivity of Azoheteroarene Thin Layers by Photothermal Beam Deflection and Photothermal Lens Methods

Mikaeeli,

Korte,

Cabrera

et al. 2023

Materials

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A comparison between Hankel and Fourier methods for photothermal radiometry analysis

Sheikh,

Pompidou,

Villarreal

et al. 2024

Heat Trans

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Photothermal radiometry has recently been investigated for use in the multidimensional thermal characterization of anisotropic samples. In application, there are two principal thermal models available for such characterization: a Cartesian model for the heat equation, which requires the application of three Fourier transforms to arrive at a solution (dubbed the Fourier technique), and a cylindrical model for the heat equation, which requires the application of a Hankel transform and a single Fourier transform (dubbed the Hankel technique). The Fourier technique allows for three‐dimensional characterization, while the Hankel technique is expected to greatly reduce the computational time required. As these models can be very computationally expensive, the potential to reduce this cost is of great interest. In this work, these multidimensional models are presented after which they are compared for accuracy, computational time, and assumption limitations. It was found that both the Fourier and Hankel techniques could accurately arrive at desired thermal properties, but that the Hankel Technique reduced the computational time by between 100× and 250× depending upon mesh spacings. Accuracy limitations were found as the eccentricity of the heating laser was increased with a less than 13% error being induced from a beam with a 3–1 axis ratio. The Hankel technique shows ideal application in computationally expensive models which employ a relatively circular beam shape.

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Photothermal radiometry using normalized DC component for coating thickness evaluation

Chen,

Zhang,

Jiang

et al. 2023

Journal of Applied Physics

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An improved photothermal technique for evaluating opaque coating thicknesses using a normalized DC component is proposed. The pump beam is modulated at a frequency that the generated thermal wave only exists in the coating layer and becomes invariant to the thickness changes. The DC component is normalized by the amplitude of the AC signal in order to eliminate the dependency on the pump intensity, surface absorptivity, and emissivity. Both theoretical analysis and experimental results demonstrate that the normalized DC component is linearly correlated to the coating thickness over a broad range. This method offers a significant advantage over existing photothermal methods by avoiding the tedious procedure of frequency trails for coatings of an unknown thickness. Also, the non-monotonic issue is successfully resolved.

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Recent Progress in Modulated Photothermal Radiometry

Cited by 3 publications

References 77 publications

Measuring Thermal Diffusivity of Azoheteroarene Thin Layers by Photothermal Beam Deflection and Photothermal Lens Methods

Measuring Thermal Diffusivity of Azoheteroarene Thin Layers by Photothermal Beam Deflection and Photothermal Lens Methods

A comparison between Hankel and Fourier methods for photothermal radiometry analysis

Photothermal radiometry using normalized DC component for coating thickness evaluation

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