2017
DOI: 10.1002/aelm.201700082
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Recent Advances in Understanding the Structure and Properties of Amorphous Oxide Semiconductors

Abstract: conductivity. [1] Following the discovery of SnO 2 with a similar unique combination of properties, [2] several patents were filed in the 1940s to employ TCOs as antistatic coatings and transparent heaters-long before the discovery of the now well-known Sn-doped In 2 O 3 (ITO) and Al-doped ZnO, [3] widely employed as flat panel display electrodes in the past decades. Despite great technological demand for TCOs [4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20] and extensive experimental efforts to … Show more

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Cited by 137 publications
(166 citation statements)
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“…As shown in Figure , all of the as‐deposited films exhibited higher N values when deposited at high P H2O . In general, the N of a ‐In 2 O 3 ‐based TCOs, including a ‐IZO, a ‐ITO, and a ‐In 2 O 3 :H, can be controlled by the oxygen deficiency in the film . Herein, only P H2O was varied; the O 2 and Ar flow rates were constant.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…As shown in Figure , all of the as‐deposited films exhibited higher N values when deposited at high P H2O . In general, the N of a ‐In 2 O 3 ‐based TCOs, including a ‐IZO, a ‐ITO, and a ‐In 2 O 3 :H, can be controlled by the oxygen deficiency in the film . Herein, only P H2O was varied; the O 2 and Ar flow rates were constant.…”
Section: Resultsmentioning
confidence: 99%
“…In general, the N of a-In 2 O 3 -based TCOs, including a-IZO, a-ITO, and a-In 2 O 3 :H, can be controlled by the oxygen deficiency in the film. [59,61] Herein, only P H2O was varied; the O 2 and Ar flow rates were constant. Therefore, the oxygen deficiency in the film increased with increasing P H2O because of the presence of H radicals and ions produced in the plasma during deposition.…”
Section: Structural Propertiesmentioning
confidence: 99%
“…To preserve neutrality, some In atoms have a valence of +1 instead of +3. This results in a random distribution of valence and charge fluctuations-a distribution which is thought to give rise to a stochiometric disorder [38] and may give rise to extended defect states [39]. In addition to structural and chemical disorder, there is longer-scale disorder stemming from the films' characteristic undulating morphology.…”
Section: Discussionmentioning
confidence: 99%
“…Therefore, the sum of chemical potential values (left side of Eqs. (2)(3)(4)(5)) determines the transition boundary between the formation/decomposition of secondary phases only. The appearance of reverse reactions results in decomposition onset of secondary phases to their elementary phases.…”
Section: Point Defect Energeticsmentioning
confidence: 99%