“…[ 11,33,35 ] At low temperatures, ion migration is expected to be suppressed due to high activation energies [ 11,12,25,28,33,36–38 ] and interface traps are widely believed to become the dominant mechanism leading to hysteresis. [ 11,12,25,33 ] As temperature‐dependent measurement can help to shed more light onto the causes of hysteresis, we will revisit this discussion later. Based on the output and transfer curves, we have estimated the FET mobility in the saturation regime to be = 4 ×10 −3 cm 2 V −1 s −1 at room temperature for our best device (see Supporting Information and Figure S3, Supporting Information, for more details).…”