It
is well known that higher requirements have been put forward
for the computing efficiency and storage speed of the data processing
of memory devices in the post Moore era. In particular, if a memory
device with multiple physical characteristics can be developed, it
will play an important role in realizing multifunctional applications
of electronic systems. Here, a nanoscale memristor device with a Ag/TiO
x
/CeO
y
/F-doped
SnO2 structure was prepared, which shows many interesting
physical phenomena with the changing of the applied voltage. In the
low-voltage region (<1.5 V), the device presents a volatile property,
while it presents a nonvolatile behavior when a higher voltage (>2
V) was applied. Interestingly, the non-zero-crossing current–voltage
(I–V) hysteresis behavior
caused by the internal electromotive force appears in the voltage
region of 0.5–1 V. Furthermore, as the applied voltage increases,
the device gradually displays ideal memristor behavior and exhibits
the standard resistance switching characteristic accompanied by the
negative differential resistance effect in the region of 3.5–4.0
V. Therefore, this nanoscale device with multiple physical properties
opens up a promising way for understanding the emerging physical phenomena,
and it will be expected to become a potential candidate for the next
generation of multifunctional electronic devices.