2009
DOI: 10.1364/oe.17.007922
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Realization and characterization of an XUV multilayer coating for attosecond pulses

Abstract: Multilayer techniques are used to obtain high reflectivity in the XUV spectral region. This work presents the realization of aperiodic multilayer mirrors for attosecond pulse compression and their characterization through reflectivity and photoemission spectroscopy measurements.

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Cited by 33 publications
(16 citation statements)
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“…This can be achieved either by using a synchrotron beam line, the phase shift ϕ out n (ω) − ϕ in (ω) being obtained via the photocurrent technique [33][34][35][36], or a HHG beam line as in the present case.…”
Section: Methods Of Characterisationmentioning
confidence: 99%
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“…This can be achieved either by using a synchrotron beam line, the phase shift ϕ out n (ω) − ϕ in (ω) being obtained via the photocurrent technique [33][34][35][36], or a HHG beam line as in the present case.…”
Section: Methods Of Characterisationmentioning
confidence: 99%
“…Up to now, most multilayer mirrors for attosecond sources have been designed to work at near normal incidence [21,23,26,27]. However, as HHG sources are linearly polarised, it is in principle possible to increase the reflectivity by increasing the angle of incidence.…”
Section: Objectivesmentioning
confidence: 99%
“…60 Short pulses with 170-130 as duration have been demonstrated in the region of 75-105 eV using Mo/Si multilayers with a reflectivity of 5%-10%. 61,62 Dispersion control above 100 eV can be achieved using different multilayers like Mo/La 63 and Mo/B 4 C 58 to avoid a discontinuous response at the Si-L absorption edge (100 eV). An extremely short pulse duration of sub-50 can be achieved by using a Mo/B 4 C/Si/B 4 C aperiodic multilayer with the spectrum from 20 to 112 eV, as shown in Figure 5.…”
Section: Broadband Multilayer For High Temporal Resolutionmentioning
confidence: 99%
“…The incidence angles on the sample range from 12.7 to 26.6 , with a mean angle of 20 . A plane mirror (Au coated silicon wafer, R $ 0.675 for grazing angle of 10 ) is positioned between the source and the objective in order to protect the Mo/Si multilayers against possible contamination from laser plasma debris. The samples were mounted on a two axis translation stage in order to move the surface with respect to the impinging beam spot.…”
Section: Samples and Damage Testing Proceduresmentioning
confidence: 99%