Real-time x-ray scattering study of surface morphology evolution during ion erosion and epitaxial growth of Au(111)

Murty, M. V. R. K.; Curcic, T.; Judy, A.; Cooper, B. H.; Woll, Arthur; Brock, J. D.; Kycia, S.; Headrick, R. L.

doi:10.1103/physrevb.60.16956

Cited by 49 publications

(15 citation statements)

References 34 publications

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“…The behavior observed in our study exhibits noticeable differences compared to that found in an SXS study of the homoepitaxial growth and ion erosion of (reconstructed) Au(111) surface under ultra-high-vacuum conditions . Here, step flow etching was found above 270 °C, followed by quasi-layer-by-layer removal between 90 and 220 °C .…”

Section: Discussioncontrasting

confidence: 85%

“…48 Here, step flow etching was found above 270 °C, followed by quasi-layer-bylayer removal between 90 and 220 °C. 48 At room temperature ion irradiation led to 3D roughening of the surface. Hence, the vacancy interlayer transport is significantly enhanced in the electrochemical environment, most likely due to the enhancement of the Au surface mobility by adsorbed chloride.…”

Section: Discussionmentioning

confidence: 80%

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Real-Time Surface X-ray Scattering Study of Au(111) Electrochemical Dissolution

et al. 2010

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Direct in situ surface X-ray scattering studies of electrochemical dissolution at technologically relevant rates are presented using Au(111) electrodes in acidic chloride-containing solutions as an example. The dissolution process was investigated with high time resolution by monitoring the time-dependent X-ray intensity at selected positions in reciprocal space and by simultaneously recording high-quality electrochemical data. With increasing electrode potential, transitions from step-flow to layer-by-layer dissolution, manifesting as layering oscillations in the X-ray intensity as well as in electrochemical current−time transients, are observed prior to surface passivation. A quantitative analysis based on an atomic-scale structural model reveals that the dissolution process proceeds via progressive vacancy island nucleation in the whole active dissolution regime with next-layer nucleation occurring at comparatively low critical coverages between θc = 0.29 and θc = 0.44. This dissolution behavior shows the same characteristics as the intermediate “smooth multilayer growth” regime recently introduced in kinetic growth theories.

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Section: Discussioncontrasting

confidence: 85%

Section: Discussionmentioning

confidence: 80%

Real-Time Surface X-ray Scattering Study of Au(111) Electrochemical Dissolution

et al. 2010

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“…Various strategies for real-time X-ray scattering have been developed. One possible technique based on the time evolution of anti-Bragg intensity has been developed in order to track the layer-by-layer growth (or deviations from this) of PEN and similar molecules on oxide substrates. − Grazing-incidence small-angle X-ray scattering (GISAXS), a technique complementary to GIWAXS, can recover the shape and distribution of growing molecular islands at submicrometer scale in real time. − …”

Section: Introductionmentioning

confidence: 99%

Real-Time Monitoring of Growth and Orientational Alignment of Pentacene on Epitaxial Graphene for Organic Electronics

Hodas

Šiffalovič

Nádaždy

et al. 2018

ACS Appl. Nano Mater.

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The interaction between a graphene layer and pentacene (PEN) molecules leads to the formation of a lyingdown phase, which can improve charge transport for organic vertical field effect transistors and enhance the optical absorption for increased light harvesting in organic solar cells. Here, we present a comprehensive study of PEN growth on epitaxial graphene on silicon carbide (SiC). Simultaneous grazing-incidence small-and wide-angle X-ray scattering (GISAXS/GIWAXS) were used in situ for real-time monitoring of the PEN crystal growth with millisecond time resolution to identify two distinct anisotropic growth stages after the nucleation of the first monolayer (ML). In the first stage up to 1.5 nm, we observe rapid growth of pentacene domains along the ( 010) and ( 001) facets. This growth behavior is saturating after 1.5 nm. In a second stage, this is followed by continuous lateral crystal growth in only one in-plane direction (100) forming needle-shaped domains. In the second stage, an uninterrupted linear growth of the lying-down PEN phase is found based on the (001) diffraction up to 15 nm. Ex situ atomic force microscopy and polarized confocal Raman microscopy were used to further support the real-time observations of aligned PEN films on graphene.

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“…Additional information on atomic or molecular island density evolution, which may exhibit oscillations due to island nucleation and coalesce during growth, can be obtained by monitoring diffuse (off-specular) X-ray scattering. 36,37 The diffuse scattering can be detected for in situ experiments in real time, 20,[38][39][40] thanks to the advent of modern two dimensional X-ray detectors. Information obtained from the evolution of the diffuse scattering is complementary to that from the intensity evolution at the anti-Bragg point and it is important for an unambiguous interpretation of reciprocal space data.…”

Section: Introductionmentioning

confidence: 99%

Influence of C60 co-deposition on the growth kinetics of diindenoperylene–From rapid roughening to layer-by-layer growth in blended organic films

Lorch

Novák

Banerjee

et al. 2016

The Journal of Chemical Physics

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We investigated the growth of the two phase-separating materials diindenoperylene (DIP) and buckminsterfullerene C with different mixing ratio in real-time and in situ by X-ray scattering experiments. We found that at room temperature, mixtures with an excess of DIP show a growth mode which is very close to the perfect layer-by-layer limit with DIP crystallites forming over the entire film thickness. An unexpected increase in the island size is observed for these mixtures as a function of film thickness. On the other hand, equimolar and C dominated mixtures grow with poor crystallinity but form very smooth films. Additionally, it is observed that higher substrate temperatures lead to an increase in the length scale of phase separation with film thickness.

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Real-time x-ray scattering study of surface morphology evolution during ion erosion and epitaxial growth of Au(111)

Cited by 49 publications

References 34 publications

Real-Time Surface X-ray Scattering Study of Au(111) Electrochemical Dissolution

Real-Time Surface X-ray Scattering Study of Au(111) Electrochemical Dissolution

Real-Time Monitoring of Growth and Orientational Alignment of Pentacene on Epitaxial Graphene for Organic Electronics

Influence of C60 co-deposition on the growth kinetics of diindenoperylene–From rapid roughening to layer-by-layer growth in blended organic films

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