“…X-ray diffraction (XRD) is one of the most powerful non-destructive tools to investigate materials, as their wavelength is commensurate with the distance between atoms within a crystal [ 1 , 2 , 3 , 4 , 5 , 6 , 7 , 8 , 9 ]. Successive improvements of both the X-ray sources (from X-ray tubes to third generation synchrotrons) and detectors (from photographic plates and gas counters to fast two-dimensional arrays) have led to a tremendous increase in the quantity of data recorded per unit time, allowing real time in situ or in operando measurements [ 10 , 11 ]. It is now possible to determine the 3D grain microstructure of a bulk material with a submicron resolution (using topo-tomography), to follow the evolution of the elastic strain state of the grains of a polycrystal during mechanical tests (3D-XRD, far field diffractometry), or to measure the distribution of strains within a few grains in real time (2D diffractometry) [ 12 , 13 ].…”