Real-time study of the interplay between phase formation and stress evolution at the
W1−xSix/a−Si
interface
Bärbel Krause,
Clarisse Furgeaud,
Cédric Mastail
et al.
Abstract:Nanoscale W1−xSix layers with different Si content were deposited by magnetron sputtering on amorphous silicon layers. The structure and stress evolution during deposition were monitored and in real time. Thus, it was possible to disentangle different origins of stress built-up (interface formation, phase formation, grain growth, and texture) on the nanoscale. It was found that the bcc phase with a composition-dependent texture forms at low Si content (less than 10% Si), but only above a critical thickness. A… Show more
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