1995
DOI: 10.1103/physrevb.52.5136
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Real-time spectroscopic ellipsometry study of the growth of amorphous and microcrystalline silicon thin films prepared by alternating silicon deposition and hydrogen plasma treatment

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Cited by 137 publications
(58 citation statements)
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“…We showed that both surface and growth zone processes are involved in the growth of µc-Si:H [12][13] . Moreover, the optical models used to analyse the ellipsometry measurements indicate that the nucleation of crystallites takes place in a highly porous layer below the film surface 14 .…”
Section: Introductionmentioning
confidence: 90%
“…We showed that both surface and growth zone processes are involved in the growth of µc-Si:H [12][13] . Moreover, the optical models used to analyse the ellipsometry measurements indicate that the nucleation of crystallites takes place in a highly porous layer below the film surface 14 .…”
Section: Introductionmentioning
confidence: 90%
“…13,20 Another example is the amorphous-tonanocrystalline transformation of hydrogenated silicon thin films upon exposure to H atoms from a H 2 plasma. [21][22][23] Furthermore, nanometer-size diamonds have been formed from multiwalled carbon nanotubes ͑MWCNTs͒ and carbon onions by exposure to H atoms from a H 2 plasma or electronbeam exposure at or above 1000 K; 9,24,25 interactions of H atoms with MWCNTs have been speculated to be responsible for the transformation of MWCNT walls to diamond nanocrystals. 24 The underlying mechanism of the H-induced structural transition in MWCNTs leading to nanocrystalline carbon is not well understood.…”
Section: Introductionmentioning
confidence: 99%
“…Several techniques can be used to eliminate the incubation layer during the first stages of nc-Si : H growth: variable hydrogen dilution [13] and cyclical variation of hydrogen dilution [14] during hot-wire CVD process were employed to create a seed layer of Si nanocrystals. Layadi et al [15] used layer-by-layer deposition with an appropriate ratio of a-Si : H deposition time to hydrogen plasma treatment time to produce a fully crystallized interface. Van den Donker et al [16] tailored the initial SiH 4 density to prevent the formation of the incubation layer and deposit microcrystalline silicon films from pure SiH 4 .…”
Section: Introductionmentioning
confidence: 99%