Real-time non-linear de-embedding

Vanaverbeke, Frederik; Raedt, W. De; Schreurs, Dominique; Bossche, Marc Vanden

doi:10.1109/arftg77.2011.6034573

Cited by 7 publications

(4 citation statements)

References 7 publications

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“…This last step is actually very important. In fact, if strong nonlinear capacitive effects are present, nonlinear embedding procedure must be applied to properly move the reference plane from the intrinsic current generator to the device tabs [17], [18].…”

Section: Guidelines For Contours Drawingmentioning

confidence: 99%

A Reappraisal of Optimum Output Matching Conditions in Microwave Power Transistors

Quaglia

Shepphard

Cripps

2017

IEEE Trans. Microwave Theory Techn.

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This paper presents a novel approach to the identification of output power and efficiency contours in microwave power transistors in compressed regime. The formulation is based on a polynomial representation of the drain-source voltage profile accounting for the knee region. Closed-form equations for the output power and efficiency as function of the fundamental load are demonstrated, enabling the plot of contours on a Smith Chart. From these, a further simplified drawing procedure for approximated contours is also derived, differentiating between two families of output characteristic. The first, with smooth knee, is usually experienced in GaN devices, while the second exhibits a steep knee which can be associated with GaAs devices' typical behavior. A 5-W GaN HEMT, a 2.5-W GaN HEMT, and a 0.7-W GaAs pHEMT are characterized with load-pull measurements. In all the three cases, the proposed method results in a very accurate contour construction, despite being based on an approximated output current/voltage profile and on a rough estimate of output equivalent capacitance. IndexTerms-Field-effect transistors, high-efficiency amplifiers, power amplifiers (PAs).

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Section: Guidelines For Contours Drawingmentioning

confidence: 99%

A Reappraisal of Optimum Output Matching Conditions in Microwave Power Transistors

Quaglia

Shepphard

Cripps

2017

IEEE Trans. Microwave Theory Techn.

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“…After this step, the resistive core voltages and currents are available. By using the nonlinear de‐embedding technique, the waveform engineering can be performed at the measurement phase by monitoring in real time the dynamic load line at the CGP, while optimum source and loading conditions are achieved at the accessible EP …”

Section: Measurement‐based Waveform Engineeringmentioning

confidence: 99%

“…By using the nonlinear de-embedding technique, the waveform engineering can be performed at the measurement phase by monitoring in real time the dynamic load line at the CGP, while optimum source and loading conditions are achieved at the accessible EP. 66 As a case study, a 0.25-mm GaN HEMT with a total periphery of 200 mm is considered, whose bias condition was set at V DQ 5 20 V, I DQ 5 15 mA (i.e., class-AB operation) and the fundamental frequency at 5 GHz. Before performing the large-signal characterization, the optimal value of the load termination was estimated according to the Cripps' load-line theory 3,12 for the considered operating conditions.…”

Section: High-frequency Waveform Engineeringmentioning

confidence: 99%

Waveform engineering: State-of-the-art and future trends (invited paper)

Raffo

Vadalà

Bosi

et al. 2016

Int. J. RF Microw. Comput. Aided Eng.

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The term waveform engineering denotes all those circuit design techniques that are based on shaping the transistor voltage and current waveforms. From a general perspective, these design techniques can be grouped in two main categories according to the adopted design tool: measurement- and model-based. In the last two decades, thanks to the proliferation of setups enabling calibrated waveform acquisition at microwave frequencies, waveform engineering has attracted continuously increasing interest in the microwave engineering community. In this article, a comprehensive analysis of the waveform-engineering based design techniques is reported, paying particular attention to the advantages and drawbacks associated to each approach

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“…This poses a challenge when such circuits need to be analysed during device prototyping, as conventional measurement techniques treat the device under test (DUT) as a black box, i.e., only the input and output port-based response of the device is measured providing traditional metrics like gain, efficiency etc., with no indication of the internal device operation. While real-time de-embedding methods in conjunction with active load-pull (LP) allow inspection of the intrinsic drain current and voltage, without the readily-available distributed packaged transistor models they are still just the port based measurements providing no information of the internal distributed device operation [3]. The distributed device behaviour has been addressed in the simulation domain by the introduction of multiphysics-based modelling approaches [1], [4].…”

Section: Introductionmentioning

confidence: 99%

An Electro-Optic Pulsed NVNA Load–Pull System for Distributed <inline-formula> <tex-math notation="LaTeX">$E$ </tex-math> </inline-formula>-Field Measurements

Urbonas

Kim

Vanaverbeke

et al. 2018

IEEE Trans. Microwave Theory Techn.

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In this paper, a new combined electro-optic and pulsed nonlinear vector network analyser-based load-pull measurement system for distributed multi-harmonic electric field measurements is presented. The system uses an external electrooptic probe to measure cross-frequency phase-coherent multiharmonic vector E-fields with an 8 µm spatial resolution and 20 MHz-20 GHz bandwidth. We demonstrate the performance of the distributed phase-coherent E-field measurements of Ex, Ey and Ez components with 3 harmonics above a commercially available large periphery, packaged, laterally diffused metaloxide-semiconductor (LDMOS) transistor. The transistor was measured at 2.2 GHz under pulsed conditions with 10 µs pulse and 10 % duty cycle, while outputting 55.1 dBm of power. The measured electric fields of the operating transistor are animated for the first time and reveal complex non-uniform operation at harmonic frequencies.

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Real-time non-linear de-embedding

Cited by 7 publications

References 7 publications

A Reappraisal of Optimum Output Matching Conditions in Microwave Power Transistors

A Reappraisal of Optimum Output Matching Conditions in Microwave Power Transistors

Waveform engineering: State-of-the-art and future trends (invited paper)

An Electro-Optic Pulsed NVNA Load–Pull System for Distributed <inline-formula> <tex-math notation="LaTeX">$E$ </tex-math> </inline-formula>-Field Measurements

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