2023
DOI: 10.1007/s10845-023-02110-7
|View full text |Cite
|
Sign up to set email alerts
|

Real-time defect detection of TFT-LCD displays using a lightweight network architecture

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2023
2023
2024
2024

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(1 citation statement)
references
References 30 publications
0
1
0
Order By: Relevance
“…Deep-learning-based object detection methods no longer require handcrafted features but instead learn relevant features directly through training. The detection performance improves with increasing amounts of data, leading to successful applications in various fields [11]. Dimitriou et al [12] introduced a model based on a three-dimensional convolutional neural network capable of identifying defects on wafers.…”
Section: Introductionmentioning
confidence: 99%
“…Deep-learning-based object detection methods no longer require handcrafted features but instead learn relevant features directly through training. The detection performance improves with increasing amounts of data, leading to successful applications in various fields [11]. Dimitriou et al [12] introduced a model based on a three-dimensional convolutional neural network capable of identifying defects on wafers.…”
Section: Introductionmentioning
confidence: 99%