2024
DOI: 10.3390/electronics13081551
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Real-Time Defect Detection in Electronic Components during Assembly through Deep Learning

Eyal Weiss,
Shir Caplan,
Kobi Horn
et al.

Abstract: This paper introduces a pioneering method for real-time image processing in electronic component assembly, revolutionizing quality control in manufacturing. By promptly capturing images from pick-and-place machines during the interval between component pick-up and mounting, defects are identified and promptly addressed in line. This proactive approach ensures that defective components are rejected before mounting, effectively preventing issues from ever occurring, thus significantly enhancing efficiency and re… Show more

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