Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003
DOI: 10.1109/ipfa.2003.1222750
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Real case studies of fast wafer level reliability (FWLR) EM test as process reliability monitor methodology

A. Yap1,
Tok Wang Ling2,
H.K. Yap3
et al.
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