1996
DOI: 10.1002/bbpc.19961000805
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Reactivity of the oxide growth process on zr metal in aqueous potassium iodide and other alkali halide solutions

Abstract: The kinetics of growth of an oxide film on Zr electrode under open circuit conditions in K1 solutions were investigated using potential and impedance measurements. The effect of some parameters such as surface pre-treatment, concentration and salt type, including alkali halide anions, on the reactivity of the oxide growth process were studied. In all cases the potential, capacitance and resistance were followed with time, and the oxide film was found to thicken continuously.The iodide ion is assumed to partici… Show more

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Cited by 2 publications
(2 citation statements)
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“…Higher rates of formation are usually associated with higher degree of surface and bulk imperfections in the oxide, such an oxide will be more reactive than the one grown at lesser rate (in the concentrated NaN 3 solution) characterized by better insulating properties. Similar behaviour has been reported previously for zirconium metal in KI solutions [29]. …”
Section: Spontaneous Oxide Film Growthsupporting
confidence: 74%
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“…Higher rates of formation are usually associated with higher degree of surface and bulk imperfections in the oxide, such an oxide will be more reactive than the one grown at lesser rate (in the concentrated NaN 3 solution) characterized by better insulating properties. Similar behaviour has been reported previously for zirconium metal in KI solutions [29]. …”
Section: Spontaneous Oxide Film Growthsupporting
confidence: 74%
“…This angle varies between a maximum limit of 908 for ideal dielectric surface oxide with excellent insulating properties and a minimum limit of 08 for the very reactive system. As shown in Table 2, the value of h reaches up to values close to 708 for the dilute 0.1 M solution and increases to about 808 for the concentrated 2.0 M solution, but since h < 908 it means that the metal/solution interface can not be considered as a perfect capacitor [29].…”
Section: Ac Impedance Measurements At the Rest Potential And Data Modmentioning
confidence: 99%