2002
DOI: 10.1088/1367-2630/4/1/339
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Reactivity of methane in a nitrogen discharge afterglow

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Cited by 29 publications
(29 citation statements)
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“…Although, we do not have enough evidence to propose a complete mechanism to account for the formation of the SiO 2 thin films, in line with the previous results by Jauberteau 25 and other authors, 9,10 it is reasonable to assume that the formation of the oxide film from TMSCl is a process that involves the adsorption on the substrate of either the precursor molecule or some reactive fragments resulting from its activation and eventual fragmentation. On the surface, the competition between the polymerization of these fragments to yield SiO x C y H z polymeric chains and the oxidation or etching of organic fragments of these films leading to the removal of organic components will control the formation of SiuO bonds.…”
Section: Plasma-enhanced Chemical Vapor Deposition Thin-film Formasupporting
confidence: 81%
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“…Although, we do not have enough evidence to propose a complete mechanism to account for the formation of the SiO 2 thin films, in line with the previous results by Jauberteau 25 and other authors, 9,10 it is reasonable to assume that the formation of the oxide film from TMSCl is a process that involves the adsorption on the substrate of either the precursor molecule or some reactive fragments resulting from its activation and eventual fragmentation. On the surface, the competition between the polymerization of these fragments to yield SiO x C y H z polymeric chains and the oxidation or etching of organic fragments of these films leading to the removal of organic components will control the formation of SiuO bonds.…”
Section: Plasma-enhanced Chemical Vapor Deposition Thin-film Formasupporting
confidence: 81%
“…This results contrasts with those reported by other authors showing the formation of SiO 2 thin films by using TMS in plasma microwave reactors with downstream configurations. 13,24 Jauberteau et al 25 have reported that an afterglow Ar plasma may yield a large fragmentation of the TMS molecule, mainly via SiuC bond breaking. This process principally generates Si(CH 3 ) fragments.…”
Section: Plasma-enhanced Chemical Vapor Deposition Thin-film Formamentioning
confidence: 99%
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“…OH radicals, as O and H atoms, are key species for the initiation of combustion since they are the main species responsible for breaking C-H bonds in hydrocarbon fuels [25]. OH emission is characterized by a violet band system centred at 309 nm due to theA 2 →X 2  transition [26], [27].…”
Section: B Spectroscopic Investigationsmentioning
confidence: 99%
“…It is indicated that the oxygen atoms are consumed or quenched under this condition, as analyzed in previous works. [8,17,18] In conclusion, a coaxial-cylinder dielectric barrier discharge is used to activate a premixed CH 4 /air Bunsen flame. The physical appearance of the Bunsen flame and its changes are directly imaged by transient OH/CH-PLIF imaging while the emission spectra of these flames are recorded.…”
mentioning
confidence: 99%