1994
DOI: 10.1016/0039-6028(94)90405-7
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Reaction of ultrathin Co layers with Si(111) and Si(100) surfaces

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Cited by 22 publications
(8 citation statements)
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“…Our results for clean surfaces thus agree with previous work described in Refs. [4][5][6][9][10][11][12][13]. It is known that hydrogen desorption from the Si surface is only significant above 300°C, and that the Si-H bond is particularly strong with a bond energy of 3.5 eV compared to the Si-Si bond energy of 2.3 eV [38].…”
Section: Resultsmentioning
confidence: 98%
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“…Our results for clean surfaces thus agree with previous work described in Refs. [4][5][6][9][10][11][12][13]. It is known that hydrogen desorption from the Si surface is only significant above 300°C, and that the Si-H bond is particularly strong with a bond energy of 3.5 eV compared to the Si-Si bond energy of 2.3 eV [38].…”
Section: Resultsmentioning
confidence: 98%
“…Unlike previous work described in Refs. [4][5][6][9][10][11][12][13] for the growth of Co films on clean surfaces, the growth of Co on H-terminated surface does not occur by either growth of Co-Si mixture in a layer-by-layer mode or via formation of a Co-Si solid solution with inter-diffusion of Co and Si atoms.…”
Section: Curve Fitting Using Layer By Layer Growth Modelmentioning
confidence: 96%
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“…Even for room temperature deposition, interface silicides can formed. For example, in the case of Co deposition on Si, it has been shown by many groups [12][13][14][15][16][17] that for sub-monolayer of Co deposition, Co reacts with Si to form the CoSi 2 phase even at room temperature. When the Co coverage increases, the deposited film becomes less and less rich in Si and a pure Co layer can be formed after the deposition of about 4-5 ML.…”
Section: Resultsmentioning
confidence: 99%