2009
DOI: 10.2207/qjjws.27.204s
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Reaction between GaN and Metallic Deposition Films

Abstract: The interfacial microstructures of two typical contact films for gallium nitride (GaN) have been investigated by transmission electron microscopy. One is a 300-nm-thick Ni single-layer deposited on p-type GaN and then annealed at 873 K. Ni 5 Ga 3 is formed at the interface by the post-deposition anneal. As the other product of the interfacial reaction, N 2 voids are formed bulging to the Ni-side. The other contact film consists of four layers: Ti, Al, Ni, and Au, at the initial state. By annealing at 873 K for… Show more

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Cited by 5 publications
(4 citation statements)
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“…Although the relation is different from that observed in previous reports [10,13], the existence of such a relation implies the formation of TiN adjacent to GaN. The electric conduction profile between two 1.0-mm-distant contact films on Sample 1 is shown in Figure 2.…”
Section: Resultscontrasting
confidence: 64%
See 2 more Smart Citations
“…Although the relation is different from that observed in previous reports [10,13], the existence of such a relation implies the formation of TiN adjacent to GaN. The electric conduction profile between two 1.0-mm-distant contact films on Sample 1 is shown in Figure 2.…”
Section: Resultscontrasting
confidence: 64%
“…Formation of TiN by interfacial reaction between GaN and Ti generates nitrogen vacancies in GaN, which work as donors at an energy level close to the conduction band edge of GaN. Therefore, TiN is formed adjacent to GaN generally by interfacial reaction between GaN and multilayered metallic film containing Ti layer [7][8][9][10]. However, this method has a problem.…”
Section: Introductionmentioning
confidence: 99%
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“…GaN and Pd are divided by Au-Ni clusters. Unlike [18], no NixGay or NixNy phases were observed. It is well established that Ga-face p-GaN exhibits robust chemical resistance [19].…”
Section: Pd/ni/au Contact On P-gan Annealed In N2 Atmospherementioning
confidence: 88%