2009
DOI: 10.1107/s0021889809026636
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Re-evaluation of formulae for X-ray stress analysis in polycrystalline specimens with fibre texture: experimental confirmation

Abstract: Line splitting or line broadening of an X‐ray Bragg reflection owing to a three‐dimensional or biaxial load on a cubic polycrystalline specimen with 〈111〉 fibre texture has been predicted by Yokoyama & Harada [J. Appl. Cryst. (2009), 42, 185–191] if the specimen is in the symmetry of the Laue class mm. By using a TiN film specimen and a high‐precision four‐circle diffractometer with a laboratory X‐ray source, it is shown that the profile of the 420 reflection is substantially different with and without biaxial… Show more

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Cited by 8 publications
(6 citation statements)
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“…The crystallographic texture of W thin films allows for a simple and straightforward analysis of the mechanical properties. However, for elastically anisotropic polycrystalline films (Dong & Srolovitz, 1998;Martinschitz et al, 2009;Yokoyama et al, 2009;Faurie et al, 2010), micromechanical models taking account of the actual microstructure have to be used, due to the interaction of differently oriented grains. For instance, polycrystalline thin films with mixed crystallographic textures can be subjected to heterogeneous triaxial stress states arising from grain interactions that are crucial to the understanding of the mechanical behaviour of these films (Nix, 1989;Vinci, 2008;Vodnick et al, 2010).…”
Section: Conclusion and Perspectivementioning
confidence: 99%
“…The crystallographic texture of W thin films allows for a simple and straightforward analysis of the mechanical properties. However, for elastically anisotropic polycrystalline films (Dong & Srolovitz, 1998;Martinschitz et al, 2009;Yokoyama et al, 2009;Faurie et al, 2010), micromechanical models taking account of the actual microstructure have to be used, due to the interaction of differently oriented grains. For instance, polycrystalline thin films with mixed crystallographic textures can be subjected to heterogeneous triaxial stress states arising from grain interactions that are crucial to the understanding of the mechanical behaviour of these films (Nix, 1989;Vinci, 2008;Vodnick et al, 2010).…”
Section: Conclusion and Perspectivementioning
confidence: 99%
“…Line broadenings were detected in all observed diffraction peaks because of small particle sizes presented in the TiN film. The values of FWHM were more than two times wider than the value 0.094° for the (222) reflection and about four times larger along the direction of the (420) reflection (Yokoyama et al , 2009). All the profiles observed were symmetrical so that it was relatively straightforward to strip off the Cu K α 2 peaks.…”
Section: Methodsmentioning
confidence: 98%
“…In this study, a TiN thin film with a thickness of about 1 μm, which was obtained by sputtering TiN on a polyimide film of a 6 mm×40 mm surface with thickness of 125 μm, was used. This is the same specimen used in the previous XRD study (Yokoyama et al , 2009). The TiN film specimen was previously confirmed to be [111] preferred oriented along the direction normal to the film surface.…”
Section: Methodsmentioning
confidence: 99%
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“…(2009), 14) the separation of two Bragg peaks, δ2θ (I) − δ2θ (II), is given in Eq. (7), where δ2θ (I) is the shift of diffraction angle owing to strain in the type I crystallites and δ2θ (II) is that for type II.…”
Section: Line Broadening Inferred From Stressstrain Relationshipmentioning
confidence: 99%