RCWA and FDTD modeling of light emission from internally structured OLEDs

Callens, Michiel; Marsman, Herman; Penninck, Lieven; Peeters, Patrick; Groot, Harry de; Meulen, Jan Matthijs ter; Neyts, Kristiaan

doi:10.1364/oe.22.00a589

Cited by 26 publications

(9 citation statements)

References 13 publications

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“…Using the AFM-IR technique in conjunction with numerical calculations, 76–81 e.g., finite element methods (FEM), finite-difference time-domain (FDTD) method, or less calculation resources demanding (but limited to periodic systems) rigorous coupled-wave analysis (RCWA) allow for quantitative interpretation of the measured spectra. 59–64 Optical properties of thin films such as IR absorption per unit volume of a biaxial sample with ɛ i = 2 n i k i can be calculated by: …”

Section: Introductionmentioning

confidence: 99%

Polarization-Dependent Atomic Force Microscopy–Infrared Spectroscopy (AFM-IR): Infrared Nanopolarimetric Analysis of Structure and Anisotropy of Thin Films and Surfaces

Hinrichs

Shaykhutdinov

2018

Appl Spectrosc

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Infrared techniques enable nondestructive and label-free studies of thin films with high chemical and structural contrast. In this work, we review recent progress and perspectives in the nanoscale analysis of anisotropic materials using an extended version of the atomic force microscopy-infrared (AFM-IR) technique. This advanced photothermal technique, includes polarization control of the incoming light and bridges the gap in IR spectroscopic analysis of local anisotropic material properties. Such local anisotropy occurs in a wide range of materials during molecular nucleation, aggregation, and crystallization processes. However, analysis of the anisotropy in morphology and structure can be experimentally and theoretically demanding as it is related to order and disorder processes in ranges from nanoscopic to macroscopic length scales, depending on preparation and environmental conditions. In this context IR techniques can significantly assist as IR spectra can be interpreted in the framework of optical models and numerical calculations with respect to both, the present chemical conditions as well as the micro- and nanostructure. With these extraordinary analytic possibilities, the advanced AFM-IR approach is an essential puzzle piece in direction to connect nanoscale and macroscale anisotropic thin film properties experimentally. In this review, we highlight the analytic possibilities of AFM-IR for studies on nanoscale anisotropy with a set of examples for polymer, plasmonic, and polaritonic films, as well as aggregates of large molecules and proteins.

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Section: Introductionmentioning

confidence: 99%

Polarization-Dependent Atomic Force Microscopy–Infrared Spectroscopy (AFM-IR): Infrared Nanopolarimetric Analysis of Structure and Anisotropy of Thin Films and Surfaces

Hinrichs

Shaykhutdinov

2018

Appl Spectrosc

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“…Because losses are so high, there is a lot of potential for improvement. A plurality of solutions have been proposed to increase OLED efficiency, such as high-index substrates [3], grating-assisted outcoupling [4][5][6] and many others [7]. We refer to the work of Brütting et al [8] for an overview.…”

Section: Introductionmentioning

confidence: 99%

Anisotropic materials in OLEDs for high outcoupling efficiency

2015

Self Cite

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Abstract:We present the results of an optical study in which we evaluate the effect of anisotropic electron transport layers (ETL) and anisotropic hole transport layers (HTL) on the outcoupling efficiency of bottom emitting organic light emitting diodes (OLEDs). We demonstrate that optical anisotropy can have a profound influence on the outcoupling efficiency and introduce a number of design rules which ensure that light extraction is enhanced by anisotropic layers.

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“…The challenge of incoherent emitters has been addressed by using many equally (Lee et al 2003;Kim et al 2014) or randomly (Lee et al 2005) distributed dipoles with random initial phases or by multiple runs with single dipoles at different positions which are incoherently superimposed afterwards (Callens et al 2014). The long propagation lengths require long domain sizes (Callens et al 2014). Due to memory limitations, these are not realizable in 3D simulations and the domain is truncated by perfect mirrors after a few micrometers (Lee et al 2003(Lee et al , 2005Kim et al 2014).…”

Section: Introductionmentioning

confidence: 99%

FDTD modelling of nanostructured OLEDs: analysis of simulation parameters for accurate radiation patterns

Lüder

Gerken

2019

Opt Quant Electron

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Nanostructures in OLEDs allow to manipulate the radiation pattern and direct light of a specific wavelength into a specific angle in the far field by resonant light outcoupling. We present a theoretical study investigating simulation conditions for accurate radiation patterns employing the FDTD method. Radiation patterns of single dipole emitters placed in a sufficiently large simulation domain are superimposed to model the incoherent emission of a continuous emission layer. The necessary simulation domain size is derived by considering propagation length and field profile of the guided mode of a corresponding unstructured OLED. A 5 nm mesh resolution is determined as a good compromise between accuracy and simulation time. The position of an emitter with respect to the grating has a large influence on the radiation pattern. Nevertheless, we demonstrate for nine different OLED structures that the radiation pattern of a homogeneous emission layer is approximated with an amplitude error of less than 5% by superimposing only four equally spaced dipoles at positions ± (1∕8, 3∕8, 5∕8, 7∕8) ⋅ ∕2 , which avoid points of high symmetry.

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RCWA and FDTD modeling of light emission from internally structured OLEDs

Cited by 26 publications

References 13 publications

Polarization-Dependent Atomic Force Microscopy–Infrared Spectroscopy (AFM-IR): Infrared Nanopolarimetric Analysis of Structure and Anisotropy of Thin Films and Surfaces

Polarization-Dependent Atomic Force Microscopy–Infrared Spectroscopy (AFM-IR): Infrared Nanopolarimetric Analysis of Structure and Anisotropy of Thin Films and Surfaces

Anisotropic materials in OLEDs for high outcoupling efficiency

FDTD modelling of nanostructured OLEDs: analysis of simulation parameters for accurate radiation patterns

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