“…However, very high quality diffraction data from significantly smaller crystals, including submicrometresized samples, are often achievable using SFX methods (Gati et al, 2017;Nass, Redecke et al, 2020). Consequently, various sample-presentation strategies have been developed to minimize background noise for SFX, because nanometre-sized to micrometre-sized crystals produce weaker diffraction data compared with traditionally sized samples (Awel et al, 2018;Beyerlein et al, 2017;Calvey et al, 2019;Dasgupta et al, 2019;Davy et al, 2019;Doak et al, 2018;Echelmeier et al, 2019;Fuller et al, 2017;Grunbein & Nass Kovacs, 2019;Lieske et al, 2019;Martiel et al, 2019;Meents et al, 2017;Mehrabi et al, 2019;Monteiro et al, 2019;Nass, Gorel et al, 2020;Nogly et al, 2016;Oberthuer et al, 2017;Orville, 2017;Owen et al, 2017;Roedig et al, 2017;Schulz et al, 2018Schulz et al, , 2019Shelby et al, 2020;Sierra et al, 2016;Stagno et al, 2017;Suga et al, 2020;Sugahara et al, 2017;Weinert et al, 2017;Wiedorn et al, 2018;Zhao et al, 2019). In addition, X-ray pulse durations of tens of femtoseconds and the tight focus and intensity of XFEL pulses often produce very high-quality data sets with little or no radiation-induced effects in the data and refined atomic models.…”