2017
DOI: 10.1039/c7ja00294g
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Rapid, molecule-free, in situ rare earth element abundances by SIMS-SSAMS

Abstract: We present a novel method for rapid and high-sensitivity in situ measurements of the rare earth elements (REEs) by combined secondary ion mass spectrometry and single-stage accelerator mass spectrometry (SIMS-SSAMS).

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Cited by 8 publications
(16 citation statements)
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“…Exponential fits to the molecular transmissions are also shown. As discussed in Groopman et al6 , the molecular dissociation cross sections appear to approximately scale with bond dissociation energy (e.g., Ta-O = 839 kJ/mol; La-O = 798; U-O = 758; Ti-O = 666; Si-Si = 310;…”
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confidence: 90%
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“…Exponential fits to the molecular transmissions are also shown. As discussed in Groopman et al6 , the molecular dissociation cross sections appear to approximately scale with bond dissociation energy (e.g., Ta-O = 839 kJ/mol; La-O = 798; U-O = 758; Ti-O = 666; Si-Si = 310;…”
mentioning
confidence: 90%
“…On the SSAMS, the range of the switching is limited to the flight tube bias relative to the ion energy: ±20 kV / 304.5 kV ≈ ±6.5%. The gap lenses and flight tube act as an Einzel lens of non-ideal geometry, which affects the focal properties of the beam 6 . Within the ±6.5% switching range these effects are minor and we do not observe any fractionation.…”
Section: Nautilus Overviewmentioning
confidence: 99%
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