“…Contingent upon sample properties and incident X-ray beam intensity, high resolution XRD patterns can be acquired in ≤20 s using this detector. 37 For the purpose of this study, the CIP detector was first aligned and calibrated using a Si(1 1 1) analyzer crystal and the LaB 6 powder standard (SRM 660a, National Institute of Standards and Technology, Gaithersburg, MD, USA). Incident monochromatic X-rays of wavelength 0.70087 Å, as calibrated with SRM 660a, were used in this work.…”