Rapid imaging of calcite crystal growth using atomic force microscopy with small cantilevers

Paloczi, George T.; Smith, B. L.; Hansma, Paul K.; Walters, D. A.; Wendman, Mark A.

doi:10.1063/1.122237

Cited by 72 publications

(51 citation statements)

References 25 publications

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“…So far, applications of small cantilevers have mainly been focused on the highspeed imaging in liquid using amplitude modulation AFM (AM-AFM) [24,16,25]. These previous works demonstrated the improved time response of dynamic-mode AFM obtained by the small cantilevers.…”

Section: Introductionmentioning

confidence: 99%

Atomic-resolution imaging in liquid by frequency modulation atomic force microscopy using small cantilevers with megahertz-order resonance frequencies

et al. 2012

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Abstract. In this study, we have investigated the performance of liquid-environment FM-AFM with various cantilevers having different dimensions from theoretical and experimental aspects. The results show that the reduction of the cantilever dimensions provides improvement in the minimum detectable force as long as the tip height is sufficiently long compared with the width of the cantilever. However, we also found two important issues to be overcome to achieve this theoretically-expected performance. The stable photothermal excitation of a small cantilever requires much higher pointing stability of an excitation laser beam than that for a long cantilever. We present a way to satisfy this stringent requirement using a temperature controlled laser diode module and a polarization-maintaining optical fiber. Another issue is associated with the tip. While a small carbon tip formed by electron beam deposition (EBD) is desirable for small cantilevers, we found that an EBD tip is not suitable for atomic-scale applications due to the weak tip-sample interaction. Here we present that the tip-sample interaction can be greatly enhanced by coating the tip with Si. With these improvements, we demonstrate atomic-resolution imaging of mica in liquid using a small cantilever with a megahertz-order resonance frequency. In addition, we experimentally demonstrate the improvement in the minimum detectable force obtained by the small cantilever in the measurements of oscillatory hydration forces.

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Section: Introductionmentioning

confidence: 99%

Atomic-resolution imaging in liquid by frequency modulation atomic force microscopy using small cantilevers with megahertz-order resonance frequencies

et al. 2012

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“…This makes probes with high (300 kHz or greater) resonant frequencies very desirable so that the number of pixels measured per second is high (500 s−1 or greater) and imaging times remain small (10 minutes or less for a typical 512 × 512 image). [42][43][44][45][46] Detection system Numerous detection systems have been developed to measure the motion of the cantilever. By far the most popular is an optical method commonly referred to as optical beam deflection47-49 (see Fig.…”

Section: Probe Designmentioning

confidence: 99%

High-speed atomic force microscopy for materials science

Payton

Picco

Scott

2016

International Materials Reviews

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Since its inception in 1986, the field of atomic force microscopy (AFM) has enabled surface analysis and characterisation with unparalleled resolution in a wide variety of environments. However, the technique is limited by very low sample throughput and temporal resolution making it impractical for materials science research on macro sized or time evolving samples such as the observation of corrosion. The potential of AFM sparked intense efforts to overcome these limitations shortly after its invention, and has led to the development of high-speed atomic force microscopes (HS-AFMs). Within the last 5 years the technology underpinning these instruments has matured to the point where routine imaging can achieve megapixels per second over scan areas of square millimetres, removing the limitations from AFM for industrial scale materials characterisation. This review explains the technology and looks to the future use of HS-AFMs in materials science.

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“…[27][28][29][30][31][32] Especially, De Yoreo et al have shown that it is possible to change the shape of calcite by adding, e.g., magnesium or acidic amino acids to the growth solution of calcite. 33,34 In this paper we want to image calcite in liquids, because it provides atomic resolution.…”

Section: Measurements In Liquid On Calcitementioning

confidence: 99%

Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudes

Wutscher

Giessibl²

2011

Review of Scientific Instruments

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We report on atomic force microscopy (AFM) in ambient and liquid environments with the qPlus sensor, a force sensor based on a quartz tuning fork with an all-electrical deflection measurement scheme. Small amplitudes, stiff sensors with bulk diamond tips and high Q values in air and liquid allow to obtain high resolution images. The noise sources in air and liquid are analyzed and compared for standard silicon cantilevers and qPlus sensors. First, epitaxial graphene was imaged in air, showing atomic steps with 3 Å height and ridges. As a second sample system, measurements on calcite (CaCO 3 ) in liquids were performed in water and polyethylenglycol (PEG). We demonstrate high resolution images of steps in PEG on calcite and nanolithography processes, in particular with frequency-modulation AFM the controlled dissolution of calcite monolayers.

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Rapid imaging of calcite crystal growth using atomic force microscopy with small cantilevers

Cited by 72 publications

References 25 publications

Atomic-resolution imaging in liquid by frequency modulation atomic force microscopy using small cantilevers with megahertz-order resonance frequencies

Atomic-resolution imaging in liquid by frequency modulation atomic force microscopy using small cantilevers with megahertz-order resonance frequencies

High-speed atomic force microscopy for materials science

Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudes

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