2005
DOI: 10.1016/j.physc.2005.02.095
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Rapid and simple measurement of critical current density in HTS thin films using a permanent magnet method

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Cited by 37 publications
(29 citation statements)
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“…The code can be executed by specifying an assumed critical current density j C . In the present study, we use the assumed value, 0.1 MA/cm 2 ≤ j C ≤ 10 MA/cm 2 , where the assumed values of j C derives from Ohshima's experimental results [2,3].…”
Section: Numerical Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The code can be executed by specifying an assumed critical current density j C . In the present study, we use the assumed value, 0.1 MA/cm 2 ≤ j C ≤ 10 MA/cm 2 , where the assumed values of j C derives from Ohshima's experimental results [2,3].…”
Section: Numerical Resultsmentioning
confidence: 99%
“…As a novel noncontact method for measuring j C , Ohshima et al proposed the permanent magnet method for measuring the critical current density j C in a HTS thin film [2,3]. While moving a permanent magnet placed above an HTS thin film, they measure an electromagnetic force acting on the film.…”
Section: Introductionmentioning
confidence: 99%
“…Ohshima et al proposed another contactless method for measuring j C [4,5]. In the method, while moving a permanent magnet above an HTS film, the electromagnetic force acting on the film is measured.…”
Section: Introductionmentioning
confidence: 99%
“…They conclude that can be evaluated from the threshold current. On the other hand, Ohshima et al have proposed the permanent magnet method [7], [8]. While moving a permanent magnet above an HTS film, the electromagnetic force acting on the film is measured.…”
Section: Introductionmentioning
confidence: 99%