1999
DOI: 10.1080/10420159908226995
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Ranges and energy-loss measurement of 1.0–4.7 MeV/u28Si ions in Makrofol-G using padc as detector

Abstract: and-conditions-of-access.pdf This article may be used for research, teaching and private study purposes. Any substantial or systematic reproduction, redistribution , reselling , loan or sub-licensing, systematic supply or distribution in any form to anyone is expressly forbidden. The publisher does not give any warranty express or implied or make any representation that the contents will be complete or accurate or up to date. The accuracy of any instructions, formulae and drug doses should be independently ver… Show more

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Cited by 5 publications
(3 citation statements)
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“…The evaluation of range and energy loss of swift heavy ions in solids continues to evoke considerable research interests because of their vital importance in many scientific disciplines [4][5][6][7][8]. Most of these studies require a precise knowledge of heavy ion energy-loss rate and ranges in various commonly used dielectrics [9][10][11][12]. Polymers provide a unique opportunity to measure the range of heavy ions because the complete trajectory of the ion track from its entrance nearly to its end point can be viewed optically [5,6,11,13].…”
Section: Introductionmentioning
confidence: 99%
“…The evaluation of range and energy loss of swift heavy ions in solids continues to evoke considerable research interests because of their vital importance in many scientific disciplines [4][5][6][7][8]. Most of these studies require a precise knowledge of heavy ion energy-loss rate and ranges in various commonly used dielectrics [9][10][11][12]. Polymers provide a unique opportunity to measure the range of heavy ions because the complete trajectory of the ion track from its entrance nearly to its end point can be viewed optically [5,6,11,13].…”
Section: Introductionmentioning
confidence: 99%
“…The increase of track-diameter with etching time gives a measure of the bulk-etch rate (Î ) along the surface plane Î ´ ¾Øµ (1) where, is the diameter of the track after etching time Ø. The true track lengths (Ä) were then calculated from measured projected track lengths using the formulations [12] as follows: Ä Ð Ó׳µ · Î Ø × Ò³µ Î ´Ø Ø µ (2) where, Ð is the projected track length as observed by the microscope, ³ is the angle of irradiation,´Î Ø × Ò³µ is the surface etching correction, Ø is the etching time, Ø is the complete etching time that corresponds to a fixed value of track diameter which is independent of temperature of a given etchant and dielectric [13].…”
Section: Theoretical Aspectsmentioning
confidence: 99%
“…Electrons are low LET radiations, which mostly affect the physical and chemical properties of polymeric films. In the last few years, lot of work has been done to characterize and improve track detectors for better detection sensitivity [1] as well as charge and energy resolutions. The nuclear track technique is quite versatile [2], simple and accurate.…”
Section: Introductionmentioning
confidence: 99%