Abstract:The depth profiles of 25 -100-keV Ne+ and Ne+ ions itnp$anted into C, Si, V, Co, Ni, Zr, Nb, Ag, Hf, %', and Au backings have been measured with the (p, y) resonance broadening technique. The modal, mean, and standard-deviation values were determined for the range profiles extracted from the measured y-ray yield curves. The theoretical predictions were calculated with the computer-simulation code cosa"o for both amorphous and polycrystalline structures. The experimental modal ranges corrected for sputtering ag… Show more
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